Tuesday, February 16, 2021 | |
Session 1: EU Policies and Microelectronics |
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11:00 | Opening remarks by Laith Altimime, President, SEMI Europe |
11:10 | Overview of EU policies supporting the growth of microelectronics in Europe |
Marco Ceccarelli, Programme Officer, European Commission Overview of EU policies supporting the growth of microelectronics in EuropeAbstract Biography |
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Session 2: Smart Manufacturing 4.0: Metrology Advances for Digitized ECS (Semiconductor and Automotive) Industry 4.0 – the ‘MADEin4’ Initiative’ |
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12:00 | Welcome remarks by Marek Kysela, Advocacy Coordinator, SEMI |
12:10 | MADEin4 Project Introduction: Metrology Advances for Digitized ECS (Semiconductor and Automotive) Industry 4.0 |
Ilan Englard, Applied Materials Israel (AMIL) MADEin4 Project Introduction: Metrology Advances for Digitized ECS (Semiconductor and Automotive) Industry 4.0Abstract Biography |
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12:30 | Advance X-Ray Metrology Equipment As Part Of A European Semiconductor and Automotive Industry 4.0 Cycle Time and Yield Improvements Scheme |
Juliette Vandermeer, Head of Application Development X-ray, Bruker Advance X-Ray Metrology Equipment As Part Of A European Semiconductor and Automotive Industry 4.0 Cycle Time and Yield Improvements SchemeAbstract Biography |
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12:50 | Combining manufacturing data with Design for improved process performance Andres Torres, Mentor |
13:10 | New industry 4.0 metrology approaches driven by predictive in line control requirements: At the frontier between academic studies and industrial world |
Bernard PELISSIER, Head of the EquipEx IMPACT project and team, LTM-CNRS New industry 4.0 metrology approaches driven by predictive in line control requirements: At the frontier between academic studies and industrial worldAbstract Biography |
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13:39 | Social Robot Collaboration use cases |
Meirav Hadad-Segev, Founder and CEO, Brillianetor Social Robot Collaboration use casesAbstract Biography |
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14:00 | Meet the Experts |
Session 3: METIS |