Tuesday, November 12, 2019 |
|
Digitized Electronics & Industry 4.0: The MADEin4 Initiative
|
Moderation |
Marek Kysela, Semi Europe
|
15:15 |
Welcome |
|
Marek Kysela, SEMI Europe
|
15:20 |
Metrology Advances for Digitized ECS Industry 4.0 (MADEin4 Overall Concept) |
|
Dr. Nitin Singh Malik, Applied Materials
|
15:40 |
Metrology Platforms Developments for Enhanced Productivity |
|
Frank De Jong, Thermo Fisher
|
16:00 |
Industry 4.0 Predictive Yield and Tools Performance Pilot Line for Enhanced Productivity |
|
Michael Chomat, Mentor
|
16:20 |
Industry 4.0 Digitization of Manufacturing for Enhanced Productivity |
|
Yoav Hirch, Tower Jazz
|
16:40 |
Role of METIS in ECS skills |
|
Emir Demircan, SEMI Europe
|
16:55 |
Closing remarks |
|
Emir Demircan, SEMI Europe
|