| Tuesday, November 12, 2019 |
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Digitized Electronics & Industry 4.0: The MADEin4 Initiative
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| 15:15 |
Welcome |
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SEMI
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| 15:20 |
Metrology Advances for Digitized ECS industry 4.0 (MADEin4 Overall Concept) |
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Ilan Englard, Applied Materials
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| 15:40 |
Metrology platforms developments for enhanced productivity |
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Frank de Jong, Thermo Fisher
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| 16:00 |
Industry 4.0 predictive yield and tools performance pilot line for enhanced productivity |
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Andres Torres, Mentor
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| 16:20 |
Industry 4.0 digitization of manufacturing for enhanced productivity |
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Patrizia Vasquez, STMicroelectronics
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| 16:40 |
Closing remarks
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