Tuesday, October 7, 2014 | |
12:15 | Leading Techniques for the Nano-scale Etching and Deep Etching of Silicon |
Michelle Bourke, Business Group Director , Oxford Instruments Leading Techniques for the Nano-scale Etching and Deep Etching of Silicon![]() Abstract CV of presenting author |
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12:30 | Coventor Software Platform: Speed, Accuracy & Automation in MEMS Development |
Sondra Di Sabatino, Sales Director Europe, Coventor Sales Director Europe Coventor Software Platform: Speed, Accuracy & Automation in MEMS Development![]() Abstract CV of presenting author |
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12:45 | The Experts Behind the Mask |
Michael McCallion, Business Development Manager, Compugraphics International ltd The Experts Behind the Mask![]() Abstract CV of presenting author |
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13:00 | Multi Sensor Metrology for Control of MEMS Production |
Bastian Marheineke, Head of Sales, FRT GmbH Multi Sensor Metrology for Control of MEMS ProductionAbstract CV of presenting author |
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13:15 | Wafer Thinning Using a Versatile, State-of-the-Art Single Wafer Processor |
Mark Goeke, Product Manager, Dainippon Screen Deutschland GmbH Wafer Thinning Using a Versatile, State-of-the-Art Single Wafer Processor![]() Abstract CV of presenting author |