Tuesday, November 14, 2017 | |
Session |
Opening |
13:15 | Welcome Speech |
Anne-Marie Dutron, Chief Technology Officer Emerging Technologies, SEMI Europe | |
13:30 | Start up in Saxony! |
Armin Reith, Head of Business Unit Microelectronics/ICT, Wirtschaftsförderung Sachsen GmbH (Saxony Economic Development Corporation) | |
13:50 | Smart Systems Hub - Enabling Start-ups |
Frank Bösenberg, CEO, Silicon Saxony Management GmbH | |
Session |
Start-Up Pitches |
14:00 | Roll to Roll CVD Graphene Technology for Transparent Electrode and Flexible Display |
Yoo Yeob Jung, CEO, Nanotech Digital GmbH Roll to Roll CVD Graphene Technology for Transparent Electrode and Flexible Display![]() ![]() Abstract Biografie |
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14:07 | Engineered Si-based Substrates for the State-of-the-art RF Devices - A Characterization Perspective |
Mostafa Emam, CEO, Incize Engineered Si-based Substrates for the State-of-the-art RF Devices - A Characterization Perspective![]() ![]() Abstract Biografie |
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14:14 | Opportunities for in-rubber electronics |
Hadrien Michaud, Founder, Feeltronix Opportunities for in-rubber electronics![]() ![]() Abstract Biografie |
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14:21 | Semiconducting carbon nanotubes and their application in sensors |
Viktor Bezugly, Research leader, Life Science Inkubator Sachsen GmbH & Co.KG Semiconducting carbon nanotubes and their application in sensors![]() ![]() Abstract Biografie |
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14:28 | Break |
15:05 | Minimal Fab: revolution technology for microelectronics |
Dmitry Yurkovets, Deputy of General Director, Tokyo Boeki (RUS) LLC Minimal Fab: revolution technology for microelectronics![]() ![]() Abstract Biografie |
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15:12 | Inline Wafer Edge Inspection - Start-Up Pich - Innovation Village |
Robin Priewald, CTO, Bright Red Systems GmbH Inline Wafer Edge Inspection - Start-Up Pich - Innovation Village![]() ![]() Abstract Biografie |
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15:19 | Superresolution multi-layer optical imaging of semiconductor samples using SMAL |
Sorin Laurentiu Stanescu, Technical Manager, LIG Nanowise Ltd Superresolution multi-layer optical imaging of semiconductor samples using SMAL![]() ![]() Abstract Biografie |
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15:26 | Speed up Wafer-level Magnetic Test |
Laurent LEBRUN, CEO, Hprobe Speed up Wafer-level Magnetic Test![]() ![]() Abstract Biografie |
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15:33 | High throughput 3D topography measurements |
Jérôme Parent, Head of material science applications, LyncéeTec SA High throughput 3D topography measurements![]() ![]() Abstract Biografie |
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15:40 | 3D Macroscopy using digital holography |
Jérôme Parent, Head of material science applications, LyncéeTec SA 3D Macroscopy using digital holography![]() ![]() Abstract Biografie |
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15:47 | Break |
16:32 | FeFET Memory - Ideal for High-Performance, Ultra-Low Power Embedded Applications |
Menno Mennenga, Business Development, Ferroelectric Memory Company GmbH FeFET Memory - Ideal for High-Performance, Ultra-Low Power Embedded Applications![]() ![]() Abstract Biografie |
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16:39 | 3D Vision for intelligent Automation and the next generation robots |
Claude Florin, CEO, Fastree3D SA 3D Vision for intelligent Automation and the next generation robots![]() ![]() Abstract Biografie |
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16:46 | Energy Filter for Ion Implantation - A major Improvement in Semiconductor Power Device Manufacturing |
Benjamin Tom, CFO, mi2-factory GmbH Energy Filter for Ion Implantation - A major Improvement in Semiconductor Power Device Manufacturing![]() ![]() Abstract Biografie |
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16:53 | The Touchless Revolution |
Maurizio Migliore, COO, Touchless Automation GmbH The Touchless Revolution![]() ![]() Abstract Biografie |
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17:00 | End |