| Thursday, November 17, 2022 |
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SCREEN: Innovation Inspired By Sustainability
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| 09:45 |
Welcome Note, Dr. Martin Hollfelder, Director of Technology and Service, Europe |
| 09:50 |
Keynote: Sustainability Driven Innovation: Transistor Scaling and Defectivity Targets for Sustainable Manufacturing, Dr. Okuno Yasutoshi, Vice President & Corporate Officer of Technology Strategy, SCREEN Semiconductor Solutions Co |
| 10:10 |
Exotic Applications of Nanosecond Laser Annealing, Dr. Sébastien Kerdilès, Head of Thermal Treatments Engineering, CEA - LETI |
| 10:30 |
Sustainable SiC: the Advantages of Engineering Substrates, Dr. Nicolas Daval, Expertise Labs Senior Manager, Soitec |
| 10:50 |
Towards Sustainable Wet Processing for Advanced Integration Technologies, Dr. Efrain Altamirano-Sanchez, R&D Manager of SIP group, imec |
| 11:10 |
How can Track Hardware Boost Lithographic Performance?, Andreia Santos, R&D Manager, SCREEN Semiconductor Solutions Co |
| 11:20 |
Reducing Bulk Chemicals by SPM Reuse in Single-Wafer Process Applications, Dr. Jim Snow, Senior Technologist, SCREEN SPE USA |
| 11:35 |
High-Volume Automatic Visual Inspection and Trench Thickness Measurement on Si, SiC, and GaN Wafers ,Alessandro Rossi, Product and Application Engineer, SCREEN SPE Europe |
| 11:50 |
SCREEN UV Laser Anneal Technology, Louis Thuries, Product Manager, SCREEN LASSE |
