A | To top | ||
AENEAS |
Rohrbach, Nadja
Building Collaborative ECS projects via the Eureka Cluster XecsAbstract Biography |
Chips Hub Europe | |
Airbus |
Ombach, Grzegorz
The Future of Air Travel will be Carbon Neutral and More AutonomousAbstract Biography |
Executive Forum | |
Alemnis AG |
Widmer, Remo
Recent innovations in Scanning electron microscope in situ mechanical testing for semiconductor failure analysisAbstract Biography |
Innovation Showcase | |
Alphawave IP |
Chan Carusone, Tony
Feeding AI’s Demand for DataAbstract Biography |
Thursday Innovation Showcase | |
Amkor Technology Europe Portugal (ATEP) |
Silva, José
Amkor Activities in Portugal and Overall Trends in EuropeAbstract Biography |
Advanced Packaging Conference | |
AMO GmbH |
Rinke, Gordon
The European 2D-Experimental Pilot Line as a Platform for Novel Sensor ConceptsAbstract Biography |
Materials Innovation | |
ams-OSRAM AG |
Milnikel, Jens
Semiconductor Companies Shaping the Transformation of the Healthcare Industry with Optical SolutionsAbstract Biography |
Smart MedTech | |
Applied Materials |
Neuber, Andreas
Sustainability Improvements in Semiconductor Manufacturing Using Smart Manufacturing TechnologiesAbstract Biography |
Smart and Green Manufacturing Summit | |
Applied Materials |
Chudzi, Michael
A Materials to Systems Understanding of a BEOL Embedded Analog NVM Memory Technology for Edge Compute ApplicationsAbstract Biography |
Future of Computing | |
ASE Europe |
Factor, Bradford
Packaging for Integrated PhotonicsAbstract Biography |
Integrated Photonics | |
ASE, Inc. |
Chang, Yin
Advanced Packaging: Enabling a New Generation of Silicon SystemsAbstract Biography |
Advanced Packaging Conference | |
ASM Belgium |
Sprey, Hessel
Opening RemarksAbstract Biography |
Materials Innovation | |
ASM International |
Givens, Michael
How Did and Will Atomic Scale Processing Change the Logic and Memory IndustriesAbstract Biography |
Materials Innovation | |
ASML |
Hajiahmadi, Reza
Wafer contamination detection: an unsupervised learning approachAbstract Biography |
Innovation Showcase | |
Athinia |
Matz, Laura
How the Semiconductor Industry can leverage Data Expertise from HealthcareAbstract Biography |
Executive Forum | |
Atotech |
Schmidt, Ralf
Optimization of the Cu Microstructure to Improve Cu-to-Cu Direct Bonding for 3D IntegrationAbstract Biography |
Advanced Packaging Conference | |
ATREG, Inc. |
Rothrock, Stephen
Overview Of The Global Semiconductor Manufacturing Asset MarketAbstract Biography |
ATREG PANEL | |
B | To top | ||
brainjo GmbH |
Gnerlich, Christian Michael
AR/VR - Metaverse :Virtual Reality for Mental & Physical health in B2BAbstract Biography |
Fab Management Forum | |
C | To top | ||
C12 |
Desjardins, Pierre
Building Scalable and Ultra-Coherent Quantum Computers with Carbon NanotubesAbstract Biography |
Future of Computing | |
Carl Zeiss Digital Innovation GmbH |
Hörr, Christian
The Pareto Principle in Industry 4.0Abstract Biography |
Fab Management Forum | |
CEA-Leti |
Joly, Sylvie
Will More-than-Moore Technologies with 3D Integration meet the Challenges of Edge AI Devices ?Abstract Biography |
Future of Computing | |
CEA-Leti |
Signamarcheix, Thomas
Opening Remarks by Session ChairAbstract Biography |
Future of Computing | |
CEA, Leti MINATEC |
Sousa, Veronique
Overview of the normally-OFF GaN-on-Si MOSc HEMT transistor in the fully recessed gate architectureAbstract Biography |
Electrification & Power Semiconductors | |
centrotherm Clean Solutions |
Stover, Adam
Effect of Gas Abatement Selection and Destruction Efficiency on Carbon Neutrality GoalsAbstract Biography |
Smart and Green Manufacturing Summit | |
Cimetrix Incorporated |
Weber, Alan
The Role of Streaming Data in Smart Manufacturing: Methods, Applications, and BenefitsAbstract Biography |
Thursday Innovation Showcase | |
CITC |
Smits, Edsger
Reliability Characterization of Silver Sintering for Die Attach ApplicationsAbstract Biography |
Advanced Packaging Conference | |
Cohu |
Wagner, Markus
The Challenges in Testing Small and Highly Integrated Devices in a Massive Parallel Test SystemAbstract Biography |
Advanced Packaging Conference | |
Comet PCT |
Jordi, Marco
PanelistAbstract Biography |
The Future of Work | |
Comet Yxlon |
Drolz, Isabella
The Future of Advanced Packaging Inspection is X-ray!Abstract Biography |
Advanced Packaging Conference | |
CSconnected |
Meadows, Chris
Driving Technology with Compound SemiconductorsAbstract Biography |
Electrification & Power Semiconductors | |
D | To top | ||
DAS Environmental Expert GmbH |
Davies, Guy
The Road To A Zero-Emission SubfabAbstract Biography |
Smart and Green Manufacturing Summit | |
Diversified Fluid Solutions |
Urquhart, Karl
Smarter, Sustainable and More Resilient Supply of Ultra High Purity NH4OH with Reduced Environmental Impact.Abstract Biography |
Smart and Green Manufacturing Summit | |
Dr. Ing. h.c. F. Porsche AG |
Frenkel, Barbara
Enabling collaboration in the Automotive value chain: Faster, more Transparent and SecureAbstract Biography |
Executive Forum | |
E | To top | ||
Edwards Vacuum |
Serapiglia, Antonio
Improving Productivity by Using Data in the SubfabAbstract Biography |
Fab Management Forum | |
Edwards Vacuum |
Jones, Chris
Collaboration - The Challenge to Reduce Emissions during a Period of GrowthAbstract Biography |
Smart and Green Manufacturing Summit | |
Edwards Vacuum |
Wilson, Kate
Sustainability of the Semiconductor IndustryAbstract Biography |
Executive Forum | |
Edwards Vacuum |
Clarke, Jill
Coming SoonAbstract Biography |
The Future of Work | |
Edwards Vacuum |
Agujar, Mark
PanelistAbstract Biography |
The Future of Work | |
Elisa IndustrIQ |
Ylä-Jarkko, Kalle
Machine Learning Solving the Puzzle in Wafer Anomaly DetectionAbstract Biography |
Thursday Innovation Showcase | |
Elmos Semiconductor SE |
Meyer, Guido
PanelistAbstract Biography |
ATREG PANEL | |
Entegris |
Amade, Antoine
Automotive Reliability – Contamination Management and Maturity of the EcosystemsAbstract Biography |
Smart Mobility | |
Ericsson Research |
Tillman, Fredrik
Industry Talk: THz Frequencies and Mobile Networks – a good blend?Abstract Biography |
ITF Beyond 5G | |
ESPAT-Consulting |
Kröhnert, Steffen
Opening RemarksAbstract Biography |
Advanced Packaging Conference | |
Evatec AG |
Rettenmeier, Roland
Opening RemarksAbstract Biography |
Advanced Packaging Conference | |
F | To top | ||
Flexciton Ltd |
Potter, Jamie
Driving Efficiency of Energy and Emission-intensive Fabrication Processes with the Next-Generation Optimization-Based PlatformAbstract Biography |
Fab Management Forum Smart and Green Manufacturing Summit |
|
Fraunhofer-Gesellschaft |
Schulze, Jörg
(Ultra-)Wide Bandgap Semiconductors for Sensor and Power Electronic ApplicationsAbstract Biography |
Electrification & Power Semiconductors | |
Fraunhofer Group for Microelectronics / Research Fab Microelectronics Germany |
Guttowski, Stephan
FMD Competence Center for Resource-Conscious Information and Communication TechnologyAbstract Biography |
Future of Computing | |
Fraunhofer Institute for Integrated Systems and Device Technology IISB |
Pfeffer, Markus
Opening RemarksAbstract Biography |
Electrification & Power Semiconductors | |
Fraunhofer Institute for Reliability and Microintegration IZM |
Nissen, Nils
Green ICTAbstract Biography |
Smart and Green Manufacturing Summit | |
Fraunhofer Research Institution for Modular Solid State Technologies EMFT |
Wieland, Robert
Green ICT – Plasma Process Alternatives to Substitute PFCs, SF6 and NF3Abstract Biography |
Smart and Green Manufacturing Summit | |
G | To top | ||
Galaxy Semiconductor |
Smith, Wes
An Omnivariate Test Data Approach to Reliability Improvement for Aerospace and Automotive ApplicationsAbstract Biography |
Thursday Innovation Showcase | |
GLOBALFOUNDRIES |
Capecchi, Simone
GlobalFoundries 22FDX® Auto grade 1 Chip Package Interaction Reliability AssessmentAbstract Biography |
Advanced Packaging Conference | |
GLOBALFOUNDRIES |
Yan, Ran
MicroLED Advance Bonding Method to enable AR MetaverseAbstract Biography |
Future of Computing | |
Graz University of Technology |
Haubenwallner, Clara
Participation in a panel discussion.Date: 15/11/2002, Time: 16:10-17:10Location: Messe MünchenWe suppose no special title is needed, as Clara is participating in the panel discussion.Abstract Biography |
The Future of Work | |
H | To top | ||
Henkel Corporation |
Trichur, Ramachandran
Semiconductor Packaging Materials Enabling Advanced Flip-Chip and Heterogeneous IntegrationAbstract Biography |
Advanced Packaging Conference | |
Holst Centre / TNO |
Hendriks, Rob
Impulse Printing™: Enabling 3D Printed Interconnects for Volume ProductionAbstract Biography |
Advanced Packaging Conference | |
I | To top | ||
IBM Zurich |
Curioni, Alessandro
Keynote OpeningAbstract Biography |
Smart and Green Manufacturing Summit | |
imec |
Peeters, Michael
OpeningAbstract Biography |
Future of Computing ITF Beyond 5G |
|
imec |
Collaert, Nadine
Tech talkAbstract Biography |
ITF Beyond 5G | |
imec |
De Simone, Danilo
EUV Lithography Patterning: Status and Challenges Towards High NAAbstract Biography |
Materials Innovation | |
imec |
Rolin, Cedric
The Environmental Footprint of Si Chip ManufacturingAbstract Biography |
Smart and Green Manufacturing Summit | |
imec |
Van den hove, Luc
Deep tech: the Lodestar to Meet the Challenges of the 21st centuryAbstract Biography |
Executive Forum | |
imec |
Marent, Katrien
WelcomeAbstract Biography |
ITF Beyond 5G | |
imec the Netherlands |
Zevenbergen, Marcel
PanelistAbstract Biography |
Smart MedTech | |
INFICON |
Behnke, John
The Digital Transformation of Semiconductor ManufacturingAbstract Biography |
Fab Management Forum | |
Infineon |
Knott, Bernhard
Innovative Sensor Packaging in EuropeAbstract Biography |
Advanced Packaging Conference | |
Infineon |
Stöckl, Martin
What Skills and Talents do we Need for the Future of Work in EuropeAbstract Biography |
The Future of Work | |
Infineon Technologies AG |
Recklies, Joerg
Opening Remarks by Session ChairAbstract Biography |
Fab Management Forum | |
Infineon Technologies AG |
Gorski, Alexander
PanelistAbstract Biography |
ATREG PANEL | |
Infineon Technologies AG |
Friedrichs, Peter
SiC Power Technologies and Business – Empower a Greener FutureAbstract Biography |
Electrification & Power Semiconductors | |
Institute of Electronics and Computer Science |
Ivanovs, Maksims
Synthetic Data for Robotics: Opportunities and ChallengesAbstract Biography |
Chips Hub Europe | |
Intel Corporation |
Scheper, Frans
Building Europe’s Digital Future - A Pan European InvestmentAbstract Biography |
Advanced Packaging Conference | |
Intel Germany GmbH & Co. KG |
Mohr, Anneclaire
Net-Zero: A Call to Action for the Semiconductor IndustryAbstract Biography |
Smart and Green Manufacturing Summit | |
IQE plc |
Pelzel, Rodney
How Advanced Epitaxy is Critical to making the Semiconductors for Next-Gen Mobile ConnectivityAbstract Biography |
ITF Beyond 5G | |
ISRL |
Zabelinsky, Ilya
Time to Collaborate. SubFAB Research and DevelopmentAbstract Biography |
Innovation Showcase | |
ITEC B.V. |
Patschkowski, Felix
Smart Test Cells: Improving Efficiency and ConvenienceAbstract Biography |
Chips Hub Europe | |
J | To top | ||
JCET |
Antonicelli, Roberto
New Trends in Mobility and Automotive Semiconductor Industry: a Supply-Chain PerspectiveAbstract Biography |
Advanced Packaging Conference Smart Mobility |
|
JCET |
Azzopardi, Mark
HFBP as a New and Better Approach to DFNAbstract Biography |
Advanced Packaging Conference | |
JCET Group |
Choon Heung, Lee
Complex, Small, Cheap: How Packaging is Going to Power the Digital AgeAbstract Biography |
Executive Forum | |
K | To top | ||
KLA Corporation (SPTS Division) |
Wood, Alex
Plasma Etch & Deposition Processes for SiC Devices in Power ApplicationsAbstract Biography |
Electrification & Power Semiconductors | |
Koh Young Europe GmbH |
Lindloff, Axel
Applying 3D Moiré interferometry measurement to semiconductor packaging applicationsAbstract Biography |
Advanced Packaging Conference | |
Kontron-AIS GmbH |
Mueller, Bert
Sensor Integration Framework with Interface AAbstract Biography |
Thursday Innovation Showcase | |
L | To top | ||
Ligentec SA |
Hessler, Thomas
Silicon Nitride based low loss Photonics Integrated CircuitsAbstract Biography |
Integrated Photonics | |
LineLab |
Nietner, Larissa
LineLab, an Analytical Tool for Modeling Semiconductor Manufacturing SystemsAbstract Biography |
Fab Management Forum | |
M | To top | ||
McLaren Applied |
Lambert, Stephen
High Performance 800V Silicon Carbide Inverters for Automotive Applications: The Next Step in Electrification?Abstract Biography |
Smart Mobility | |
Melexis |
Chombar, Francoise
Accelerating Gender Balance in the Semiconductor Talent PoolAbstract Biography |
The Future of Work | |
Merck Healthcare KGaA |
Weitzel, Uwe
PanelistAbstract Biography |
Smart MedTech | |
Merck KGaA |
Matthes, Philip
PanelistAbstract Biography |
The Future of Work | |
Microsoft |
Mailos, Mariano
The Metaverse - Embracing the 4th wave of Personal ComputingAbstract Biography |
Future of Computing | |
MSV Systems & Services Pte Ltd |
Tan, Joe
Keep It Simple & Save (KISS) in Burn-In OperationsAbstract Biography |
Innovation Showcase | |
N | To top | ||
Newcastle University |
O'Neill, Anthony
Improving 4H-SiC MOSFETs by Gate EngineeringAbstract Biography |
Electrification & Power Semiconductors | |
Niching Industrial Corp. |
Dong, Rui-Xuan
Ultra low-temperature silver sintering materials for substrate-based power applicationsAbstract Biography |
Advanced Packaging Conference | |
Nokia |
Ziegler, Volker
PanelistAbstract Biography |
ITF Beyond 5G | |
Nova Ltd |
Szafranek, Dana
Spectral Interferometry (SI) And Vertical Traveling Scatterometry (VTS) Technology For Advanced Metrology Of Back-End-Of-Line (BEOL) Manufacturing Process StepsAbstract Biography |
Innovation Showcase | |
NXP |
Oberndorff, Pascal
Opening RemarksAbstract Biography |
Advanced Packaging Conference | |
O | To top | ||
Oakland County |
Tighe, Ingrid
Coming SoonAbstract Biography |
Smart Mobility | |
Oxford Instruments Plasma Technology |
O'Mahony, Aileen
A reliable manufacturing solution to enable normally-off recessed gate GaN MISHEMT by atomic layer etch and in-situ etch depth monitoringAbstract Biography |
Thursday Innovation Showcase | |
P | To top | ||
PEER Group |
Suerich, Doug
Treading Lightly: How a Pandemic Pivot to Remote Integrations Helped Reduce our Carbon FootprintAbstract Biography |
Smart and Green Manufacturing Summit | |
PhotonDelta |
Penning de Vries, René
Next Generation Microchips, Powered by LightAbstract Biography |
Integrated Photonics | |
R | To top | ||
Robert Bosch GmbH |
Bornefeld, Ralf
Electrification for EVsAbstract Biography |
Fab Management Forum | |
Robert Bosch GmbH |
Beer, Leopold
Semiconductors for Software Defined VehiclesAbstract Biography |
Advanced Packaging Conference | |
Robert Bosch GmbH |
Araujo, Samuel
Silicon carbide boosting the path to e-mobility in various applicationsAbstract Biography |
Electrification & Power Semiconductors | |
Robert Bosch GmbH |
Laermer, Franz
Medtech-Innovation through the Fusion of Microelectronics with SensorsAbstract Biography |
Smart MedTech | |
Robert Bosch GmbH |
Mueller, Andreas
PanelistAbstract Biography |
ITF Beyond 5G | |
Robert Bosch GmbH |
Leinenbach, Patrick
PanelistAbstract Biography |
ATREG PANEL | |
Rohde & Schwarz |
Stuhlfauth, Reiner
PanelistAbstract Biography |
ITF Beyond 5G | |
Roland Berger |
Alexander, Michael
PanelistAbstract Biography |
Fab Management Forum ITF Beyond 5G |
|
Royal Philips |
van Houten, Frans
Keynote PresentationAbstract Biography |
Executive Forum | |
S | To top | ||
Samsung Electronics |
Seo, Claire HyunJung
Technology that makes Technology SustainableAbstract Biography |
Smart and Green Manufacturing Summit | |
Samsung Semiconductor Europe |
Fischer, Axel
Keynote PresentationAbstract Biography |
Executive Forum | |
Schneider Electric |
Gheno, Daniel
Electricity 4.0 : Towards a World More Digital and More ElectricAbstract Biography |
Smart and Green Manufacturing Summit | |
Schrödinger |
Elliott, Simon
Current Trends in Digital Chemistry to Drive Semiconductor InnovationAbstract Biography |
Materials Innovation | |
Scientific Visual S.A. |
Orlov, Ivan
Intelligent wafering: how to widen the bottleneck in semiconductor substrate manufacturingAbstract Biography |
Innovation Showcase | |
Scintil Photonics |
Langlois, Pascal
Advanced Photonic Integrated Circuits Solutions with Integrated Lasers for Ultimate Optical Connectivity in Datacenters, HPC and 5GAbstract Biography |
Integrated Photonics | |
SEMI |
Weiss, Bettina
Global UpdatesAbstract Biography |
Smart Mobility Fab Management Forum |
|
SEMI |
Bhat, Mousumi
A Holistic Approach to Building a Sustainable Semiconductor BusinessAbstract Biography |
Smart and Green Manufacturing Summit | |
SEMI |
Manocha, Ajit
Welcome NoteAbstract Biography |
Executive Forum | |
Semi Europe |
Melvin, Cassandra
Welcome NoteAbstract Biography |
The Future of Work Advanced Packaging Conference |
|
Semi Europe |
Frieling, Christopher
Welcome RemarksAbstract Biography |
The Future of Work | |
Semi Europe |
Altimime, Laith
Welcome NoteAbstract Biography |
Fab Management Forum Smart MedTech Smart and Green Manufacturing Summit Executive Forum |
|
SEMI Foundation |
Williams-Vaden, Michelle
The Work Force Supply-Chain Crunch and Need for a Diverse and Innovative Workforce Development.Abstract Biography |
The Future of Work | |
SHK Engineering and Consulting GmbH & Co. KG |
Kummer, Sebastian
No Fear of High Dynamics in Fab Core DesignAbstract Biography |
Fab Management Forum | |
Silicon Austria Labs GmbH |
Roshanghias, Ali
Ultra-fine pitch Die bonding approaches with Cu interconnects for high-performance 3D IC packagesAbstract Biography |
Advanced Packaging Conference | |
Soitec |
Maleville, Christophe
Industry talkAbstract Biography |
ITF Beyond 5G | |
Spiden AG |
Grünstein, Leo
Label-Free Biomarker Sensing Leveraging CMOS Technology and Photonic IntegrationAbstract Biography |
Integrated Photonics | |
ST Microelectronics |
Theveniau, Raphael
Complete LVS verification methodology and process for complex System-In-Package assembliesAbstract Biography |
Advanced Packaging Conference | |
STMicroelectronics |
Champseix, Jean-Louis
Wellbeing and Diversity and InclusionAbstract Biography |
Fab Management Forum | |
STMicroelectronics |
Alba, Simone
Opening RemarksAbstract Biography |
Fab Management Forum | |
Stockholm Environment Institute |
Michalopoulou, Eleni
Beyond ESG: How can we Maximise the Impact of our Actions Using Integrated Approaches to Enhance and Amplify Action to Achieve the Sustainable Development GoalsAbstract Biography |
Smart and Green Manufacturing Summit | |
Summa Semiconductor Oy |
Helle, Meri
Transition from the Chip and Talent Shortages to Shaping the Next Generation Skills & Talent BuildingAbstract Biography |
The Future of Work | |
SYSTEMA |
Roßbach, Philipp
How to Simplify Engineers’ life in Complex Semiconductor Manufacturing - About Democratization of Information and its Usage in Production Scheduling and Root Cause AnalysisAbstract Biography |
Fab Management Forum | |
T | To top | ||
TECHCET |
Shon-Roy, Lita
Semiconductor Market Expansion Driving Materials Innovation – Materials Market Outlook and ChallengeAbstract Biography |
Materials Innovation | |
TechInsights Inc. |
Hutcheson, Dan
Frontier of Challenge and Opportunity: Semiconductor Shortages, Geopolitics, & OutlooksAbstract Biography |
Fab Management Forum | |
Technical University of Applied Sciences Regensburg |
Ramsauer, Ralf
Jailhouse: Mixed Criticality Systems for Semicondutor ManufacturingAbstract Biography |
Fab Management Forum | |
Technical University of Sofia |
Malenkova, Slava
ECoVEM European Centre of Vocational Excellence in MicroelectronicsAbstract Biography |
The Future of Work | |
TERADYNE |
Ducrocq, David
Minimizing Execution Risk in Test Solution Development Projects with a Technical Project LeadAbstract Biography |
Innovation Showcase | |
Texas Instruments |
Schimpf, Klaus
Not availableAbstract Biography |
Fab Management Forum | |
Texas Instruments |
Thomas, Vipin Koshy
Machine Learning for Automated Image Classification in Yield EnhancementAbstract Biography |
Fab Management Forum | |
time:matters GmbH |
Kohnen, Alexander
Panel Discussion – Navigating through global developments affecting the supply chain managementAbstract Biography |
Fab Management Forum | |
Trinity College Dublin |
Boland, John
Nanoscale Metals are Comprised of Grain Boundaries that are Significantly Different from those found in Bulk MaterialsAbstract Biography |
Materials Innovation | |
TU Dublin |
Kelleher, John
Green AIAbstract Biography |
Smart and Green Manufacturing Summit | |
Tyndall National Institute |
Ghosh, Samir
Heterogeneously Integrated InP-laser on Silicon Photonics realized by Micro-Transfer PrintingAbstract Biography |
Integrated Photonics | |
W | To top | ||
Wooptix |
Gaudestad, Jan
New Metrology Technique for Measuring Patterned Wafer Geometry on a full 300mm waferAbstract Biography |
Innovation Showcase | |
X | To top | ||
X-FAB Dresden |
Tillner, Rico
How medical devices are changing the customer-foundry relationshipAbstract Biography |
Fab Management Forum | |
X-FAB Group |
Schoder, Henryk
The People Challenge: How to Overcome the Skill Shortage in the FAB´s?Abstract Biography |
Fab Management Forum | |
X-FAB Group |
U’Ren, Gregory
Industry talkAbstract Biography |
ITF Beyond 5G | |
X-FAB Semiconductor Foundries GmbH |
Kittler, Gabriel
PanelistAbstract Biography |
Integrated Photonics | |
X-FAB Silicon Foundries SE |
Bretthauer, Ulrich
Foundry Solutions for Medical Semiconductor SensorsAbstract Biography |
Smart MedTech |