A | To top | ||||||
Agileo Automation |
Golra, Fahad
Challenges and Opportunities for Adopting Digital Twins in Semiconductor IndustryAbstract Biography |
Fab Management Forum | |||||
Amkor Technology, Inc. |
Kelly, Mike
Heterogeneous IC Packaging for Advanced AI ApplicationsAbstract Biography |
Advanced Packaging Conference | |||||
Atotech |
Schmidt, Ralf
The Pivotal Role of Uniformity of Electrolytic Deposition Processes to Improve the Reliability of Advanced PackagingAbstract Biography |
Advanced Packaging Conference | |||||
ATREG, Inc. |
Rothrock, Stephen
Coronavirus, Chip Boom, and Supply Shortage: The New Normal for Global Semiconductor ManufacturingAbstract Biography |
Fab Management Forum | |||||
C | To top | ||||||
Cloud&Heat Technologies GmbH |
Struckmeier, Jens
Coming soonAbstract Biography |
Sustainable - Green & Trusted | |||||
D | To top | ||||||
Dell Technologies |
Vivolo, Lawrence
A revolution in Smart Factory is coming – driven by Autonomous, SW-defined, Service-oriented, Fully Connected Cars. Are you ready?Abstract Biography |
SMARTx - SMART Mobility | |||||
E | To top | ||||||
EBARA Precision Machinery Europe GmbH |
Richter, Reinhart
An Emergency Process Technology for EuropeAbstract Biography Dr Reinhart Richter |
Fab Management Forum | |||||
Edwards |
Jones, Chris
Broader view of sustainability challenges for a subfab in EuropeAbstract Biography |
Fab Management Forum | |||||
Edwards Vacuum |
Meredith, Richard
Mental Ill Health – The other invisible threatAbstract Biography |
Fab Management Forum | |||||
Entegris S.A.S. |
Amade, Antoine
Automotive Reliability – Contamination Management and Maturity of the EcosystemsAbstract Biography |
SMARTx - SMART Mobility | |||||
G | To top | ||||||
GLOBALFOUNDRIES |
Yan, Ran
Semiconductor Enabling Vr/AR as the New Dimension Of Human ConnectionAbstract High density area and leakage reduce with technology node shrinking
Globalfoundries microdisplay solutions
Biography |
The Future of Computing Hardware | |||||
H | To top | ||||||
Henkel Electronic Materials |
de Wit, Ruud
Thin Cu Plate-able Dielectric Material Developments for RF and Power Device MiniaturizationAbstract Biography |
Advanced Packaging Conference | |||||
I | To top | ||||||
INFICON |
Behnke, John
Smart to the Rescue!Abstract Biography |
Fab Management Forum | |||||
IO Tech |
Birnbaum, Ralph
Laser Assisted Deposition for Electronics Mass ProductionAbstract Biography |
Advanced Packaging Conference | |||||
K | To top | ||||||
Kistler Instrumente |
Hillinger, Robert
Monitor Mechanical Stress and Damage in Advanced PackagingAbstract Biography |
Advanced Packaging Conference | |||||
M | To top | ||||||
Micro Systems Technologies |
Martina, Manuel
Advanced Materials and Interconnection Technologies for Highly Miniaturized IoT ModulesAbstract Biography |
Advanced Packaging Conference | |||||
R | To top | ||||||
RENA Technologies GmbH |
Kühnlein, Holger
Advanced Silicon Carbide Single Wafer Wet Chemical Etching and Polishing at Ambient TemperatureAbstract Biography |
SMARTx - SMART Mobility | |||||
S | To top | ||||||
Schott AG |
Letz, Martin
Thin Glass for Wafer- And Panel- Level Packaging: On the Route Towards IndustrializationAbstract Biography |
Advanced Packaging Conference | |||||
Siconnex customized solutions GmbH |
Buchberger, Mario
How to Replace Conventional Wet Etch/Clean Tools with Batchspray® Equipment, While Reducing Chemical Costs and Achiving More Clean Room Space?Abstract Biography |
Fab Management Forum | |||||
Smart Systems Hub |
Klingstedt, Hans
How Edge Computing Enables Predictive Valve Maintenance in the Semiconductor IndustryAbstract Biography |
SMARTx - SMART Manufacturing | |||||
SOITEC |
Roda Neve, Cesar
Engineered Substrates and Materials for 5GAbstract Biography |
Advancements in Wireless Tech | |||||
T | To top | ||||||
Technische Hochschule Ingolstadt |
Elger, Gordon
Die-Attach Bonding with Copper Metal Pigment FlakesAbstract Biography |
Advanced Packaging Conference | |||||
Technological University Dublin |
Kelleher, John
Sustainable AI: Measuring and Reducing the Carbon Footprint of Deep Learning Model Development and InferenceAbstract Biography |
Sustainable - Green & Trusted | |||||
Tofwerk |
Frege, Carla
Vocus: The Most Sensitive Detector of Air Molecular ContaminantsAbstract Concentration decay of common inorganic acids in a FAB environment. The markers show the quantification limit of each compound. Arrows on the right axis show the 1 minute LOD of the Vocus Biography |
Fab Management Forum | |||||
TriEye |
Livne, Ziv
Seeing Beyond the Visible: The Short-Wave Infrared RevolutionAbstract Biography |
SMARTx - SMART Mobility | |||||
Z | To top | ||||||
ZIAN & Co industrial consulting and recruitment |
Zimmer, Andreas C.
Remote Operations / Training New Employees in Time of Disruption; Integrating New Training Solutions; Managing Operations when Staff is Digital.Abstract Biography |
Fab Management Forum |