A | To top | ||||||
Agileo Automation |
Golra, Fahad
Challenges and Opportunities for Adopting Digital Twins in Semiconductor IndustryAbstract Biography |
Fab Management Forum | |||||
Amkor Technology, Inc. |
Kelly, Mike
Heterogeneous IC Packaging for Advanced AI ApplicationsAbstract Biography |
Advanced Packaging Conference | |||||
Applied Materials |
Shenfeld, Amnon
Walking on the Edge: The Path to Seamless-Hybrid Cloud EnvironmentsAbstract Biography |
SMARTx - SMART Manufacturing | |||||
Atotech |
Schmidt, Ralf
The Pivotal Role of Uniformity of Electrolytic Deposition Processes to Improve the Reliability of Advanced PackagingAbstract Biography |
Advanced Packaging Conference | |||||
ATREG, Inc. |
Rothrock, Stephen
Coronavirus, Chip Boom, and Supply Shortage: The New Normal for Global Semiconductor ManufacturingAbstract Biography |
Fab Management Forum | |||||
B | To top | ||||||
Bosch |
Egger, Peter
FlexPoint – A novel inspection methodology to address typical MEMS wafer inspection challengesAbstract Biography |
SMARTx - SMART MedTech | |||||
Brewer Science |
Arnold, Kimberly
New Material Development for Advanced PackagingAbstract Biography |
Advanced Packaging Conference | |||||
Brillianetor Ltd. |
Segev-Hadad, Meirav
Giving robots and machines human-like skills to collaborateAbstract Biography |
Artificial Intelligence and Robotics in Semiconductor Industry - The MADEin4 Initiative | |||||
Bruker |
van der Meer, Juliette
Advances in X-ray Metrology under MADEin4Abstract Biography |
From Reactive to Predictive: Smart Manufacturing in the Semiconductor Industry – The MADEin4 Initiative | |||||
C | To top | ||||||
CEA-Leti |
Signamarcheix, Thomas
Frugal Artificial Intelligence For Edge DevicesAbstract Biography |
Advancements in Wireless Tech | |||||
Centro Ricerche FIAT S.C.p.A. |
Vivo, Giulio
Digital Twin methodology for energy modelling and management of body and assembly shop floorsAbstract Biography |
Artificial Intelligence and Robotics in Semiconductor Industry - The MADEin4 Initiative | |||||
Cloud&Heat Technologies GmbH |
Struckmeier, Jens
The sustainable edge computer - the greenest data centers for smart cities and citizensAbstract Biography |
Sustainable - Green & Trusted | |||||
D | To top | ||||||
Dell Technologies |
Vivolo, Lawrence
A revolution in Smart Factory is coming – driven by Autonomous, SW-defined, Service-oriented, Fully Connected Cars. Are you ready?Abstract Biography |
SMARTx - SMART Mobility | |||||
E | To top | ||||||
EBARA Precision Machinery Europe GmbH |
Richter, Reinhart
An Emergency Process Technology for EuropeAbstract Biography Dr Reinhart Richter |
Fab Management Forum | |||||
Edwards |
Jones, Chris
Broader view of sustainability challenges for a subfab in EuropeAbstract Biography |
Fab Management Forum | |||||
Edwards Semiconductor |
Wilson, Kate
Sustainability of the Semiconductor IndustryAbstract Biography |
Executive Forum 2 | |||||
Edwards Vacuum |
Meredith, Richard
Mental Ill Health – The other invisible threatAbstract Biography |
Fab Management Forum | |||||
Entegris S.A.S. |
Amade, Antoine
Automotive Reliability – Contamination Management and Maturity of the EcosystemsAbstract Biography |
SMARTx - SMART Mobility | |||||
European Commission's Directorate-General for Communications Networks, Content and Technology |
Maloney, Colette
Expanding Manufacturing Footprint in the EUAbstract Biography |
Fab Management Forum | |||||
Evatec |
Kurdzesau, Fiodar
Driving Down Cost of Ownership – New High Throughput “Cluster” Evaporation Production Tools for Wireless ApplicationsAbstract Biography |
Advancements in Wireless Tech | |||||
Excillum AB |
Laza, Simona
MetalJet – a New Key Module for Enhanced Metrology CapabilitiesAbstract Fig 1. History of X-ray sources Fig 2. Liquid Metal Jet Anode X-ray source Fig 3. Brightness of X-ray sources Biography |
From Reactive to Predictive: Smart Manufacturing in the Semiconductor Industry – The MADEin4 Initiative | |||||
F | To top | ||||||
Flexciton |
Potter, Jamie
Enabling smart fabs with next-generation production schedulingAbstract Biography |
Fab Management Forum | |||||
Fraunhofer IISB |
Erlbacher, Tobias
SiC Power MOS technology evolution as an example for sustainable and efficient energy conversion in DC gridsAbstract Biography |
Sustainable - Green & Trusted | |||||
Fraunhofer IZM |
Schischke, Karsten
The journey towards green and carbon neutral electronics: Ecodesign, materials and supply chain managementAbstract Biography |
Sustainable - Green & Trusted | |||||
G | To top | ||||||
GlobalFoundries |
Yan, Ran
Semiconductor Enabling Vr/AR as the New Dimension Of Human ConnectionAbstract High density area and leakage reduce with technology node shrinking
Globalfoundries microdisplay solutions
Biography |
The Future of Computing Hardware | |||||
GlobalFoundries |
Trewhella, Jean
Enabling Solutions through Packaging EnablementAbstract Biography |
Advanced Packaging Conference | |||||
H | To top | ||||||
Henkel Electronic Materials |
de Wit, Ruud
Thin Cu Plate-able Dielectric Material Developments for RF and Power Device MiniaturizationAbstract Biography |
Advanced Packaging Conference | |||||
I | To top | ||||||
IC'Alps |
Bernard-Moulin, Elsa
Application-Specific Integrated Circuits Pave the Way to New Innovative Electro-Therapies for Cardiology and NeurologyAbstract Biography |
SMARTx - SMART MedTech | |||||
imec |
Van den hove, Luc
The Power of Deeptech: A Tale of Bits, Molecules and EcosystemsAbstract Biography |
Executive Forum 1 | |||||
IMEC vzw |
Ashby, Thomas
Privacy Preserving Amalgamated Machine Learning (PAML) in the Fab, and machine learning workflow in the MADEin4 projectAbstract Biography |
From Reactive to Predictive: Smart Manufacturing in the Semiconductor Industry – The MADEin4 Initiative | |||||
INFICON |
Behnke, John
Smart to the Rescue!Abstract Biography |
Fab Management Forum | |||||
Infineon Technologies Austria AG |
Herlitschka, Sabine
At the crossroad: Strategic considerations for chip manufacturingAbstract Biography |
Executive Forum 3 | |||||
Intel Corp. |
B. Kelleher, Ann
Next Decade of Semiconductor Innovation in EuropeAbstract Biography |
Executive Forum 3 | |||||
IO Tech |
Birnbaum, Ralph
Laser Assisted Deposition for Electronics Mass ProductionAbstract Biography |
Advanced Packaging Conference | |||||
J | To top | ||||||
JCET |
Antonicelli, Roberto
From SoC to Chiplets: Harnessing the X-Dimension of Fan-Out PackagingAbstract Biography |
Advanced Packaging Conference | |||||
K | To top | ||||||
Kistler Instrumente |
Hillinger, Robert
Monitor Mechanical Stress and Damage in Advanced PackagingAbstract Biography |
Advanced Packaging Conference | |||||
KLA Corporation |
Donzella, Oreste
Challenges and Opportunities in Semiconductor PackagingAbstract Biography |
Executive Forum 3 | |||||
M | To top | ||||||
McKinsey & Company, Inc. |
Burkacky, Ondrej
A Changing Market for SemiconductorsAbstract Biography |
Fab Management Forum | |||||
Merck KGaA |
Wicklandt, Petra
Merck's Sustainability Strategy and our expectation to European LegislationAbstract Biography |
Executive Forum 2 | |||||
Micro Systems Technologies |
Martina, Manuel
Advanced Materials and Interconnection Technologies for Highly Miniaturized IoT ModulesAbstract Biography |
Advanced Packaging Conference | |||||
N | To top | ||||||
Nearfield Instruments |
Sadeghian, Hamed
Opportunities and challenges of high-throughput 3D metrology equipment for semiconductor process controlAbstract Biography |
Advancements in Wireless Tech | |||||
Nexperia |
Mohamed, Sajid
IMOCO4.E: Intelligent Motion Control under Industry4.EAbstract Biography |
Edge-to-Cloud Intelligence for Resilient Manufacturing – The IMOCO4.E Initiative | |||||
Nova |
Ilgayev, Ovadia
Recent Innovations in Integrated MetrologyAbstract Biography |
The MADEin4 Project: Driving Smart Manufacturing Excellence in the Semiconductor Industry | |||||
NXP Semiconductors |
Reger, Lars
Accelerating the Secure Intelligent EdgeAbstract Biography |
Executive Forum 2 | |||||
P | To top | ||||||
Philips |
Dekker, Ronald
Coming soonAbstract Biography |
Executive Forum 4 | |||||
Presto Engineering |
Patel, Claire
Automotive semiconductor packaging and testing: a paradigm shift to innovationAbstract Biography |
Advanced Packaging Conference | |||||
R | To top | ||||||
RENA Technologies GmbH |
Kühnlein, Holger
Advanced Silicon Carbide Single Wafer Wet Chemical Etching and Polishing at Ambient TemperatureAbstract Biography |
SMARTx - SMART Mobility | |||||
Robert Bosch GmbH |
Leinenbach, Patrick
Holistic AIoT in automotive semiconductor value streamAbstract Biography |
Executive Forum 3 | |||||
S | To top | ||||||
Samsung Semiconductor Europe GmbH |
Fischer, Axel
Samsung Foundry - Adding One More DimensionAbstract Biography |
Executive Forum 4 | |||||
Schott AG |
Letz, Martin
Thin Glass for Wafer- And Panel- Level Packaging: On the Route Towards IndustrializationAbstract Biography |
Advanced Packaging Conference | |||||
SEMI |
Amano, James
Introduction to SEMI Sustainability InitiativeAbstract Biography |
Fab Management Forum | |||||
Siconnex customized solutions GmbH |
Buchberger, Mario
How to Replace Conventional Wet Etch/Clean Tools with Batchspray® Equipment, While Reducing Chemical Costs and Achiving More Clean Room Space?Abstract Biography |
Fab Management Forum | |||||
Smart Systems Hub |
Klingstedt, Hans
How Edge Computing Enables Predictive Valve Maintenance in the Semiconductor IndustryAbstract Biography |
SMARTx - SMART Manufacturing | |||||
SOITEC |
Roda Neve, Cesar
Engineered Substrates and Materials for 5GAbstract Biography |
Advancements in Wireless Tech | |||||
STMicroelectronics |
Beretta, Alessandro
We create technology for a sustainable world, in a sustainable way – Our commitment to be Carbon neutralAbstract Biography |
Fab Management Forum | |||||
T | To top | ||||||
Technische Hochschule Ingolstadt |
Elger, Gordon
Die-Attach Bonding with Copper Metal Pigment FlakesAbstract Biography |
Advanced Packaging Conference | |||||
Technological University Dublin |
Kelleher, John
Sustainable AI: Measuring and Reducing the Carbon Footprint of Deep Learning Model Development and InferenceAbstract Biography |
Sustainable - Green & Trusted | |||||
TNO |
Kievit, Olaf
Introduction to the MADEin4 project: Metrology Advances for Digitized ECS Industry 4.0Abstract Biography |
From Reactive to Predictive: Smart Manufacturing in the Semiconductor Industry – The MADEin4 Initiative | |||||
TNO |
Koster, Norbert
MFIG: a Mass Filterd Ion Gauge for heavy hydrocarbon detectionAbstract Biography |
From Reactive to Predictive: Smart Manufacturing in the Semiconductor Industry – The MADEin4 Initiative | |||||
Tofwerk |
Frege, Carla
Vocus: The Most Sensitive Detector of Air Molecular ContaminantsAbstract Concentration decay of common inorganic acids in a FAB environment. The markers show the quantification limit of each compound. Arrows on the right axis show the 1 minute LOD of the Vocus Biography |
Fab Management Forum | |||||
Tokyo Electron Europe Limited |
Arnold, Joerg
Supporting Europe’s Semiconductor Expansion Through Localised Training and ServiceAbstract Biography |
Fab Management Forum | |||||
TriEye |
Bakal, Avi
Seeing Beyond the Visible: The Short-Wave Infrared RevolutionAbstract Biography |
SMARTx - SMART Mobility | |||||
TSMC Europe BV |
Marced, Maria
Digitize the FutureAbstract Biography |
Executive Forum 2 | |||||
U | To top | ||||||
Univ. Grenoble Alpes, CNRS, CEA/LETI Minatec, LTM |
Tortai, Jean-herve
Go Faster for Process Deviation: Fast Errors Detections on Large Surfaces Using EllipsometryAbstract Biography |
Artificial Intelligence and Robotics in Semiconductor Industry - The MADEin4 Initiative | |||||
V | To top | ||||||
VLSI Research |
Puhakka, Risto
Market UpdatesAbstract Biography |
Advanced Packaging Conference | |||||
Y | To top | ||||||
Yole Développement |
Mouly, Jerome
Gas and particle sensors, electronic noses in healthcare sector - a new momentumAbstract Biography |
SMARTx - SMART MedTech | |||||
Z | To top | ||||||
ZIAN & Co industrial consulting and recruitment |
Zimmer, Andreas C.
Remote Operations / Training New Employees in Time of Disruption; Integrating New Training Solutions; Managing Operations when Staff is Digital.Abstract Biography |
Fab Management Forum |