Tuesday, November 12, 2019
 

Digitized Electronics & Industry 4.0: The MADEin4 Initiative

15:15 Welcome
  SEMI
15:20 Metrology Advances for Digitized ECS industry 4.0 (MADEin4 Overall Concept)
  Ilan Englard, Applied Materials
15:40 Metrology platforms developments for enhanced productivity
  Frank de Jong, Thermo Fisher
16:00 Industry 4.0 predictive yield and tools performance pilot line for enhanced productivity
  Andres Torres, Mentor
16:20 Industry 4.0 digitization of manufacturing for enhanced productivity
  Patrizia Vasquez, STMicroelectronics
16:40

Closing remarks