Wednesday, November 14, 2018

Novel materials and nano-risk in semiconductor industry - Industrial Stakeholder event of the NanoStreeM project

12:15 Strategies for Safety Assessment in Advanced Integrated Circuits Manufacturing – Current Status and Perspectives
  Dimiter Prodanov, Imec
12:30 Current engineered nanomaterial use and hotspots of risk in semiconductor fabs. Findings of NanoStreeM
  Dimiter Prodanov, Imec
13:00 Nano REACH and advanced materials
  David Carlander, NIA
13:30 Future materials and emerging hazards
  Michael Jank, Fraunhofer IISB
14:00 2D materials: The long journey from a lab to the fab environment
  Salim El Kazzi, Imec
14:30 Panel discussion
  Moderator: Dimiter Prodanov, Imec. Panelists: David Carlander (NIA), Shane Harte (ESIA), Daniel Hristozov (University Ca’ Foscari Venice), Michael Jank (Fraunhofer IISB)
15:30 Summary statement of the panel and conclusions