Wednesday, November 14, 2018

Side Event: IMEC

12:15 Strategies for Safety Assessment in Advanced Integrated Circuits Manufacturing – Current Status and Perspectives
  Dimiter Prodanov, Imec
12:30 Current engineered nanomaterial use and hotspots of risk in semiconductor fabs. Findings of NanoStreeM
  Dimiter Prodanov, Imec
13:00 Nano REACH and advanced materials
  David Carlander, NIA
13:30 Future materials and emerging hazards
  Michael Jank, Fraunhofer IISB
14:00 2D materials: The long journey from a lab to the fab environment
  Salim El Kazzi, Imec
14:30 Panel discussion
15:30 Summary statement of the panel and conclusions