A To top
ASM Pacific Technology ASM Pacific Technology Boulanger, Richard
Innovative Panel Plating for finer line spacing and better uniformity to allow semiconductor or embedded die assembly for Heterogeneous Integration
Boulanger, Richard

Boulanger, Richard
President
ASM Pacific Technology

Boulanger, Richard

Abstract
Panel Plating requirements are much more demanding as more applications migrate from Silicon to Panel assembly such as Panel level Fan Out to leverage the large sizes of the Panels. More recently Heterogeneous Integration like Intel’s Embedded Bridge (EMIB) or various other embedded die concepts are also pushing the boundary for typical panel structures. Line widths and spaces less than 10 Microns, thickness uniformity better than 10%, via topology free of voids and the same height as the redistribution lines are critical. Traditional Panel Plating Tools are mostly for bulk processing and are not designed to handle these additional requirements so a new tool was required to overcome these challenges. An Electroplating process is used with a Single panel per reservoir approach. An overhead transporter will bring the individual panels that will have been pre inserted in a rigid panel holder designed to handle large currents as well as reduce the warpage to a series of plating reservoirs as well as pre and post processing steps with the tool . The first process is to reduce voiding by removing all air in a vacuum chamber and then inserting degassed water in the same chamber to “prewet’ the panel. The Plating cells are customized for each metal layer but include a mechanism to allow the panel to be lowered in a structure with a shield to better align the electrical current between the material anodes and the Panel Holder as well as a louvered shear plate that is activated at a certain frequency to improve the seed layering. This whole mechanism needs to be very close to the panel and minimize any warping.This presentation will demonstrate that it is possible to achieve better line density, bump thickness uniformity and void free vias to allow semiconductor like assembly for Heterogeneous Integration on a standard Printed Circuit Board instead of more expensive semi additive processes or silicon interposers

Biography
Richard Boulanger graduated as an Industrial Engineer from Ecole Polytechnique of the University of Montreal. He worked for IBM in Canada and in the United States for Semiconducotr Assembly and Ceramic Processing. He held several positions including Site Quality manager, Memory Business Unit manager and Director of Strategy.He then worked for Universal Instruments Corporation as a Vice Preseidnet of a new division to focus on Flip Chip asembly machines. Afterwards, he left for Europe as the Die Bonder Vice Presient of Kulicke and Soffa and General manager of Alphasem and then as CEO of ALSI who design Laser Dicing and Grooving machines that was rhen sold to ASM Pacific Technology.His present positio is President of ASM NEXX who design and build Wafer and Panel Plating Tools

Advanced Packaging Conference
Atotech Atotech Schmidt, Ralf
Holistic Approach to Improve the Reliability of Advanced Heterogeneous Packaging by Chemistry
Schmidt, Ralf

Schmidt, Ralf
R&D Manager Semiconductor
Atotech

Schmidt, Ralf

Abstract
Heterogeneous integration involves the assembly of separately manufactured components and requires the combination of a broad variety of different materials with different characteristics. Redistribution layers (RDLs) consisting of Cu conductor lines and organic dielectric are key components of a variety of technologies to connect the various functional components. In particular, fan out wafer level packaging (FOWLP) with decreasing lines and spaces (L/S) was developed as an enhancement to standard WLP to allow for higher performance, decreased form factor, and significant cost reduction. Next generation FOWLP require decreasing the RDL pitch down to 1 µm or even below, which involves challenges in terms of reliability of the Cu conductor lines.With decreasing L/S, mechanical properties of RDL Cu lines become increasingly important. This is especially true with regard to the variety of materials, which are in direct contact upon heterogeneous integration of different components. In order to improve the reliability of such assembly, the mechanical properties of the individual materials need to be optimized. However, this improvement is limited by issues upon scaling down the Cu conductor lines. Thus, a different approach is required to provide sufficient reliability. In addition to optimization of the individual materials, a holistic approach would include the surrounding materials within the package. Recent findings emphasize the importance of the formation of a proper composite with the adjacent dielectric to improve the reliability of the Cu conductor lines. Utilization of the surrounding materials by composite formation constitutes a promising strategy to fulfill reliability criteria of upcoming FOWLP applications. Composites may benefit from synergistic effects and overcome limitations of the individual components. Different chemistry solutions will be discussed with respect to their impact on composite formation and suitability for potential 5G applications.

Biography
For the past 8 years Ralf Schmidt has held various roles related to R&D at Atotech, wherein he focued, amongst others, on the development of innovative copper plating processes. He is currently R&D Manager Semiconductor and responsible for all R&D projects, which are related to Semiconductor and Advanced Packaging topics.Ralf is author of numerous publications and patents in this field and committee member of the Advanced Packaging as well as Stratetic Materials Conferences of Semicon Europa.

Advanced Packaging Conference
B To top
BESI Austria GmbH BESI Austria GmbH Abdilla, Jonathan
Packaging of a MOEMS LIDAR sub assembly for distance metering on a 3D housing
Abdilla, Jonathan

Abdilla, Jonathan
Manager Process Development R&D
BESI Austria GmbH

Abdilla, Jonathan

Abstract
MOEMS technology has undergone swift progress in recent decades. The ever prominent need for miniaturization and low cost has led many manufacturers to resort to MOEMS to address the optical requirements in their respective areas. One prominent use for MOEMS is in laser beam scanning systems and it is the laser sensor that most tech and car companies see as an essential component for self-driving cars. This paper addresses the challenges of packaging MOEMS actuated micro mirrors (developed by STM) to create a laser scanner sub assembly for distance metering, on a standard die bonding platform embarked upon during the L4M2 ENIAC funded project. The complexity of the packaging is attributed to several issues, from the handling of the 3D solid metal housing, requiring high precision and versatility when compared to standard flat substrates common in semiconductor assemblies, to various sub assembly procedures and handling of delicate MOEMS micro mirrors with keep-out zones and flex substrates. Such MOEMS devices also require a low defect yield in order to obtain a robust, reliable functional system. As such advanced metrology was integrated into a BESI die bonder in the form of a 3D image capturing system based on white light interferometry, capable of providing fast, real time, in-situ inspection of crucial parts, which are not possible to detect using conventional 2D cameras. Tilt measurement and bond line thickness measurement are all software features which were developed at BESI to analyse the 3D images and feedback the data for process auto correction by means of a 6-axis bondhead with possibilities of varying x, y, z, theta, Y-tilt and X-tilt positions. A new clean room kit system installed in the die bonder was also developed to address ISO class 4 and lower since MOEMS are highly susceptible to debris and foreign matter.

Biography
Jonathan Abdilla is Manager for Process Development at Besi Austria GmbH. He has a degree in Mechanical Engineering B.Eng (Hons), an MBA (Executive) from the University of Malta and a Diploma in Computing Information systems from the University of London. He has thirteen years of experience in the assembly & test of semiconductor devices. Prior to joining Besi Austria in 2014, Jonathan worked as an Assembly Line Process Engineer at STMicroelectronics Malta from 2006 until 2014. At Besi Austria, he is responsible for the Process Development group which focuses on research and development of advanced packaging and new pick and place technologies. Jonathan is also involved in coordinating Besi Austria’s participation in several national and EU funded projects.

Advanced Packaging Conference
BMW Group BMW Group Schambeck, Simon
Effect of harsh temperature ramp rates on solder joints of Wafer-Level CSPs in board level reliability tests.
Schambeck, Simon

Schambeck, Simon

BMW Group

Schambeck, Simon

Abstract
Board level reliability qualifications based on automotive mission profiles take a huge amount of time. This is caused by harsh operation conditions in the field as well as the extended lifetime requirements compared to consumer electronics. Further reduction of the testing time is the major goal of accelerated testing. Temperature cycling tests simulate thermomechanical stress in the component and its interconnect technology. Optimizing the parameters of thermal cycling conditions is the most used approach in the literature to accelerate field relevant failure mechanism. A decrease in the parameter temperature ramp time influences testing time in two ways: Reduction in cycles to failure and direct reduction of cycle time. However, the quantitative effect on lifetime and the resulting failure mechanism have to be evaluated, especially for conditions which are less usual like liquid to liquid thermal shock. Some authors argue, that different failure mechanism may be triggered by those potentially exaggerated conditions. Nevertheless, cross sections of liquid to liquid aged components can only rarely be found in the literature. This investigation shows the lifetime as well as the failure mechanism in a Wafer-Level CSP and a common 1206 resistor over a broad range of different ramp rates. This includes conventional thermal cycling and thermal shock up to liquid to liquid testing. Electrical monitoring of the WLCSP solder joints indicates, that the characteristic lifetime is decreased for harsh ramp rates. Cross sections demonstrate, that the failure mechanism is solder fatigue in all cases. Detailed analysis shows, that the microstructure aging is comparable in all stages of damage evolution in terms of precipitate coarsening, onset of recrystallization and crack growth.

Biography
Simon Schambeck received his Bachelor’s degree in Physics at the University of Regensburg, Germany in 2014 and finished his Master’s Degree in Physics in 2017. He wrote his Master’s Thesis in a working group focusing on epitaxial nanostructures. Parallel to his studies he assisted in development departments at OSRAM OLED GmbH and BMW Group. Currently he is working in the engineering department for semiconductor standards and environment simulation of the BMW Group in Munich. He is doing research on board level reliability testing for his PhD thesis including simulation of solder joint lifetime, test definition and characterization of failure mechanisms.

Advanced Packaging Conference
C To top
C.Uyemura & Co.,Ltd. C.Uyemura & Co.,Ltd. Sakuma, Yuichi
Low Phosphorus Content Of Electroless-Ni for Power Device
Sakuma, Yuichi

Sakuma, Yuichi
Deputy manager
C.Uyemura & Co.,Ltd.

Sakuma, Yuichi

Abstract
In packaging of power modules and small motors for automobile, surface finishes are required for proper solder joint formation, and Ni/Au or Ni/Pd/Au and so on are generally used as the metallization. As a deposition method of these metals, wet plating is drawing attention because of mass productivity and cost performance. Recently, SiC power devices have been developed to maximize the efficiency of the systems, however it will still take more time for the solution of thermal problems. Therefore some manufacturers has been already starting to evaluate high melting point solder (300 °C or higher). Another technical item to consider is to decrease in Si thickness. In this case, there are some problems regarding increasing wafer warpage after plating, suppression of Sn-Ni IMC thickness and crack after reflow due to the reflow temperature rising by change to high melting point solder. We found that low-P content electroless Ni can solve these issues. i) Improvement of wafer warpageAccording to Ni plated wafer warpage simulation by Stoney’s formula, when Si thickness is halved, the amount of the warpage becomes about four times greater. In our previous research, it was revealed that the differences of thermal expansion coefficient of each layer were more dominant than the internal stress of deposited Ni film for wafer warpage. From further investigation, we also found that thinner Ni improved wafer warpage regardless of P content of Ni deposit. ii) Suppression of Sn-Ni IMC thicknessBy rising reflow temperature, increasing of Sn-Ni IMC thickness and cracks are caused in case of conventional middle-P content electroless Ni. Low-P content electroless Ni deposit can suppress the Ni erosion amount than that of middle-P content. These phenomena are considered to be derived from crystal structure of Ni-P deposit. In this study, we considered the mechanism of technical advantages of Low-P content electroless Ni for thin wafer and high melting point solder.

Biography
Yuichi sakuma was employed at the C.Uyemura&Co., LTD. ,after graduated as Master of Science in chemistry from Kindai university ,Osaka Japan in 2007.Our company is the world leader in providing a solderable electroless nickel/immersion gold (ENIG) process in the printed circuit board field, and the knowledge and technique for UBM are supported from this background.

Advanced Packaging Conference
Convanit GmbH&Co.KG Convanit GmbH&Co.KG Thurner, Ines
A Roadmap for the future inline control and yield management in MEMS production
Thurner, Ines

Thurner, Ines
CEO
Convanit GmbH&Co.KG

Thurner, Ines

Abstract
The International Roadmap for Devices and Systems (IRDS) initiative focuses on maintaining a 15 year roadmap leveraging work of roadmap teams closely aligned with the advancement of the devices and systems industries. Led by an international roadmap committee (IRC), International Focus Teams (IFTs) collaborate in the development of a roadmap to help ensure alignment and consensus across a range of stakeholders. The IRDS roadmap is separated into chapters. Within the chapter of Yield Enhancement the specific requirements on inline control and yield management of MEMS production is described.New inspection and characterization challenges are generated in the production of MEMS specific technologies, devices and materials. Those cannot be covered with the existing mainstream solutions and need new innovation and solutions.These new techniques are mainly not yet available on production reliable level. Development of trend-setting methods and furthermore adaption to productive level are necessary.The roadmap describes all MEMS related requirements like wafer thickness handling, task specific inspection challenges, CD measurement, aspect ratio and material related challenges.

Biography
2010 - now Senior Consultant Yield Management, CONVANIT 2005 - 2009, Technical Manager for Yield Enhancement, Qimonda Dresden 2002 - 2005, Project Manager for Defect Density Methodology, Infineon Technologies Munich1997 - 2001, Manager of Defect Density Group, Infineon Technologies USA1993 - 1997, Process Engineer Integration, SMST GmbH Stuttgart1989 - 1993, Process Engineer for Process Control, IBM GmbH StuttgartMaster in Physics, 1989, University of Karlsruhe

MEMS along the Value Chain
E To top
Entegris SAS Entegris SAS Amade, Antoine
A new collaborative approach to defectivity challenges in the automotive industry
Amade, Antoine

Amade, Antoine
Senior Regional Director EMEA
Entegris SAS

Amade, Antoine

Abstract
By 2030, 50% of the automotive costs are expected to be electronics related with the advent of driver assistance and automation technologies. Reaching new levels of automotive innovation poses a new challenge to the industry -reaching the ppb level in failure rate at the component level.The solution is in collaboration.The purity and performance of materials will play a key role in reducing latent defects. Non-visible “black box” contamination, which can be missed by the installed metrology tools, have the potential to negatively impact the reliability of the semiconductor chips later in the life of the automobile. If the industry wants to reach the goal of “zero defects,” a new collaborative approach is necessary.The semiconductor industry is here in the 3rd generation of the contamination control strategy where baseline and excursion control could be improved with an adequate particle and metal ion management strategy focused on materials. Besides the obvious options of filtration and purification, there is a vast list of potential solutions with the challenge to identify the ones that are the most impactful to yield and defectivity. Based on benchmark, case studies, technical meetings and process reviews, this approach is practical and cost effective to implement. A collaborative engagement model exists where device makers and material purity experts work together in task force mode to build the capabilities required to enable the reliable electrification, connectivity and automation of transportation ecosystem. This is the “New Collaborative Approach”.

Biography
Mr. Amade joined Entegris in 1995 as an Application Engineer in its Semiconductor business. In his current role as EMEA Sr. Regional Director, Mr. Amade’s primary responsibilities include growing the semiconductor business in Europe and Middle East through market strategies, and in the management of a sales, customer service and marketing team. Mr. Amade held leadership positions at Entegris which included: gas microcontamination market management, strategical account management and regional sales management. Mr. Amade has a degree in Chemical Engineering from ENS Chimie Lille and he is a member of Semi Electronic Materials Group and of the Global Automotive Advisory Council for Europe.

SMART Transportation Forum
EVG EVG Brandl, Elisabeth
Mechanical Debonding for ultrathin chiplet manufacturing
Brandl, Elisabeth

Brandl, Elisabeth
Business Development Manager
EVG

Brandl, Elisabeth

Abstract
In-package integration of heterogeneous silicon to form chiplets is gaining momentum. To use vertical integration wafer thinning is of essence for heterogeneous integration of chiplets. To support the valuable wafer throughout the whole process with high yield, the employed temporary bond to a carrier wafer additionally to the separation must be well controlled and understood. Mechanical Debonding offers the advantage of using a Si support carrier in combination with room temperature debonding. For the intermediate adhesive dual layer systems with an adhesive and a release layer are studied, where the adhesive can be either a thermoplastic or a curable material. This leads not only to divergent process steps at bonding but also to a different behavior at elevated temperatures. Different materials and material classes are compared, therefor metrology for relevant parameters like total thickness variation (TTV) is employed after every critical process step to control the whole process.In the presentation we will show different temporary bonding integration flows for chiplets, such as needed for heterogeneous integration in fan out devices, as well as high performance interposer packages. In more detail, the thickness evolution during processing and thinning will be reviewed and presented by high resolution thickness maps.

Biography
Elisabeth Brandl is business development manager at EV Group for temporary and adhesive bonding. She holds a Master degree (DI) in technical physics from the Johannes Kepler University Linz specialized on nanoscience and - technology. During her master thesis at the institute of semiconductor and solid state physics she gained experience for semiconductor processing and nanofabrication.

Advanced Packaging Conference
F To top
Fraunhofer Institute Fraunhofer Institute Ambacher, Oliver
Diamond for Quantum Computing
Ambacher, Oliver

Ambacher, Oliver
Director
Fraunhofer Institute

Ambacher, Oliver

Abstract
Quantum computers exploit the phenomenon of quantum superposition, or the counterintuitive ability of small particles to inhabit contradictory physical states at the same time. An electron, for instance, can be said to be in more than one location simultaneously, or to have both of two opposed magnetic orientations. Where a bit in a conventional computer can represent zero or one, a qubit can represent zero, one, or both at the same time. It’s the ability of strings of qubits to simultaneously explore multiple solutions to a problem that promises computational speedups.Diamond-defect qubits result from the combination of “vacancies,” which are locations in the diamond’s crystal lattice where there should be a carbon atom but there isn’t one, and “dopants,” like nitrogen atoms placed in direct neighborhood to the vacancy. Together, the dopant and the vacancy create a donor-vacancy center, which has a free electron associated with it. The electrons magnetic orientation, or spin, which can be in superposition, constitutes the qubit. Donor-vacancy centers in diamond potentially can work at room temperature and are therefore considered a very attractive technology for building quantum networks. The biggest drawback to donor-vacancy centers in diamond is the difficulty of fabrication. Researchers either look for naturally-occurring defects in diamond, or fire atoms at a piece of diamond at high energy, creating defects in modulation doped lattice. We review the remarkable progress made in the past years in controlling electrons, atomic nuclei, and light at the single-quantum level in diamond. We also discuss prospects and challenges for the use of donor-vacancy centers in future quantum technologies.

Biography
Oliver Ambacher received the title of a Doctor of Natural Sciences at the Ludwig-Maximilians and the Technische Universität München in 1989 and 1993 with honors. In 1993 he received a position as scientific assistant at the Walter Schottky Institute of the Technical University of Munich. In 1995, he focused his research on the processing of GaN-based electronic and optical devices. He was instrumental in the investigation of low-dimensional electron systems in GaN-based heterostructures and quantum wells. In 1998/99 he received the opportunity to deepen his work in the field of AlGaN/ GaN-based power electronics as Feodor Lynen Fellow of the Alexander von Humboldt Foundation at Cornell University (USA). Following his habilitation in Experimental Physics 2000 and his promotion to Senior Assistant in 2001, he was appointed Professor of Nanotechnology at the Technical University Ilmenau a year later. In 2002, he was elected Director of the Institute of Solid State Electronics and two years later appointed Director of the Center for Micro- and Nanotechnologies of the TU Ilmenau. Since October 2007, Oliver Ambacher has been a professor at the Albert-Ludwigs-Universität Freiburg and director of the Fraunhofer Institute for Applied Solid State Physics.

Disruptive Computing
G To top
Globalfoundries Globalfoundries Capecchi, Simone
Chip Package Interaction Test structure design to address challenges from products with RF specific back end of line metallization options on Flip Chip ETS substrate
Capecchi, Simone

Capecchi, Simone
MTS Reliability Engineer
Globalfoundries

Capecchi, Simone

Abstract
The growing interest in applications for 5G communication has generated some efforts in developing new Back End of Line (BeoL) schemes in the Semiconductors industry. In particular, BeoL stacks with Ultra Thick Metal (UTM) for RF mmWAVE applications have come to the forefront. However the high thickness of the UTM (~3um) can induce significant residual stress, which brings up new challenges related to wafer and die warpage. The die warpage becomes quite critical during the temperature cycle that the silicon die undergoes during the flip chip assembly process.In addition, the market pressure to reduce assembly costs in packaging is driving the use of coreless Embedded Trace Substrates (ETS). The use of low cost substrates such as ETS can potentially reduce the assembly process margins: an ETS coreless substrate can be more prone to warpage during the assembly process than core substrates. The combination of silicon die and ETS substrate warpage can cause assembly yield loss as well as potential reliability issues.In this work we present the study of a Chip Package Interaction (CPI) test vehicle, with a Cu double Ultra Thick Metal implemented in a GLOBALFOUBDRIES 22FDX® BeoL stack. This test vehicle has been assembled using an Embedded Trace Substrate (ETS). This work is focusing on testing CPI structures that have been implemented to catch warpage and stress related fails through electrical test before and after the reliability environmental stress. Three different types of CPI sensor structures have been designed and implemented in the CPI test vehicle, in order to detect cracks in the BeoL and die warpage driven fails during and post assembly.Assembled dies of this test vehicle have undergone JEDEC standard reliability environmental test stresses. In conclusion, the GLOBALFOUNDRIES 22FDX® double UTM BeoL used in this work proved to be robust enough to pass the JEDEC standard reliability environmental test stress in a standard flip chip package with ETS substrate.

Biography
Simone CapecchiMember of Technical Staff, Reliability EngineeringGlobalfoundries, Dresden, GermanySimone Capecchi is currently employed as Member of Technical Staff in the Reliability Engineering Group of Globalfoundries in Dresden, Germany. The focus of his work is on Chip Package Interaction Reliability.Still in Globalfoundries Dresden, Simone spent four years in the wafer bumping engineering group sustaining high volume production as well as introducing new technologiesPrior to joining Globalfoundries, Simone lead an engineering group in STMicroelectronics for 3 years.Simone also worked as Senior Engineer in Intel Ireland and Intel US, sustaining high volume production as well transferring technologies from the development site to a high volume manufacturing site.Simone has also experience in the optical components fabrication in Nortel Networks where he developed processes for telecommunication components.

Advanced Packaging Conference
H To top
Harbor Electronics Harbor Electronics Bleakley, Tom
Stretching the Performance Envelope of ATE PCBs
Bleakley, Tom

Bleakley, Tom
VP Integration
Harbor Electronics

Bleakley, Tom

Abstract
In today's production test environment, high power, high speed, high ball count, tight pitch and increased parallelism drive complexity into the ATE interface / probe card PCB. These factors inevitably drive PCB layer counts up, beyond what can be achieved in single lamination printed circuit boards, forcing more expensive and time consuming processes such as sequential lamination and HDI techniques.This presentation will discuss PCB fabrication constraints, technology extenders and introduces an alternative to standard PCB processing techniques. Power integrity, signal integrity, manufacturing throughput and reliability characteristics of available options will be compared. Specific examples to be discussed include: -Multitier PCB with 0.3mm DUT pitch in a 310mil thick PCB. -Memory test application with 100,000 pads and via interconnects in a 600mil thick PCB -WLCSP application with 0.35mm pitch in a 250 thick PCB

Biography
Tom Bleakley is Vice President of Integration at Harbor Electronics where he oversees PCB design, assembly and test, applications and field service engineering. Tom’s team is responsible for ensuring that Harbor PCBA designs integrate well with fab, assembly and field support operations, optimizing probe card and load board PCBA performance as well as delivery times. Tom has spent his entire career in semiconductor test. Before Harbor with Everett Charles Technologies as a Product Manager. Before ECT, Tom served in Product Engineering and Test Technology roles with Intel’s Desktop Chipset group in Folsom, CA, and with Intel Communications group in Sacramento, CA. Tom began his career as a hardware design engineer with Micro Component Technology (MCT) in Shoreview, MN designing DC parametric and pin electronics hardware before moving to an Applications Engineering role. Tom holds a bachelor of science degree in electrical engineering (BSEE) from North Dakota State University.

Advanced Packaging Conference
Henkel Corporation Henkel Corporation Trichur, Ramachandran
Advanced Assembly Materials for Enabling Heterogeneous Integration and System-in-Package (SiP) Applications
Trichur, Ramachandran

Trichur, Ramachandran
Director, Global Head of Advanced Packaging Market Segment
Henkel Corporation

Trichur, Ramachandran

Abstract
For a majority of the wafer fabs and applications, as the front-end lithography nodes move towards 7nm and lower, the upfront cost of the photolithography equipment and the total cost of ownership of the process outweighs the benefit gained from this technology. Only less than a handful of manufacturers can continue to invest in the bleeding edge front end lithography technology. Due to technological complexity of such processes, the pace of node shrinkage has slowed down sharply compared to Moore’s law. In the last few years, backend packaging technology has moved from being considered an afterthought for assembling the silicon device to the forefront for improving the performance of the packaged device. Mega trends like big data, artificial intelligence, 5G connectivity and autonomous driving applications are the drivers for advanced packaging of semiconductor devices. Advanced packaging enables these next generation devices to have higher bandwidth, faster processing speeds, reduction in form factor, reduction in total cost of packaging, and other benefits depending on the packaging technology used. Advanced packaging architectures present a myriad of assembly challenges that require innovation in packaging materials and processes. Requirements for packaging density, performance and cost vary between end applications such as mobile, high performance computing and automotive components. Various challenges are addressed by advanced packaging materials in all these applications.In this paper, we will present the pain points of advanced packaging methods and recent advancements in assembly material technologies for encapsulation using liquid compression molding (LCM), underfills (CUF, NCP NCF), warpage control, electro-magnetic interference (EMI) shielding materials that enable these advanced packages. Advanced assembly material development is critical to meet the stringent performance and packaging requirements for high performance micro-electronic devices.

Biography
Ram Trichur is the Global Head for Advanced Semiconductor Packaging Market Segment in Henkel’s Adhesives Technology division. Ram has 19 years of experience in the microelectronics industry covering both the front-end wafer processing and backend assembly processes, 3 patents with over 40 publications and technical articles in leading industry conferences and magazines. Ram received his master’s degree in Electrical Engineering from University of Cincinnati and completed his executive education in business management from Stanford University’s Graduate School of Business.

Advanced Packaging Conference
I To top
IHP IHP Mai, Andreas
High performance photonic technologies for communication and sensing applications
Mai, Andreas

Mai, Andreas
Department Head
IHP

Mai, Andreas

Abstract
Photonic integrated circuits (PICs) have been subject of intense research and gained increased attention during last decades. Different wafer level technologies based on silicon-on-insulator offer platforms for novel advanced application areas as high data rate communication and photonicbio-sensing. Silicon photonic devices have the advantage that they are highly capable of being integrated, which allows an efficient combination of electronic and photonic devices with digital and analogue devices in electronic-photonic-integrated circuit (EPIC) technologies. However, silicon has drawbacks in terms of material properties and therefore in performance. In this talk, we present current progress in joint module developments of SiGe heterojunction bipolar transistors and related BiCMOS technologies in conjunction with monolithic integrated silicon photonic components. Moreover, recent results of novel integration concepts will be presented showing the potential to overcome material limitation of silicon in terms of electro-optic effects. This is followed by a brief overview of silicon-based photonic sensors for biochemical sensing. We discuss integration concepts, which are compatible to standard CMOS technologies showing the potential for future high performance silicon photonic technologies.

Biography
Prof. Dr. rer. nat. Andreas Mai received his diploma degree in physics from the Technical University of Brandenburg jointly with AMD Saxony in 2006 and his PhD in 2010. He joined the “Process Integration” group of IHP Technology Department in 2006 and he focused on the development of a 130nm SiGe-BiCMOS technology for mm-wave applications and the integration of RF-LDMOS transistors. He became group leader of the “Process Integration” team at IHP in 2012 and Head of the “Technology-Department” in 2015. Since 2018 he hold a professorship at the technical University of Applied Science Wildau for “Micro- and Nanoelectronics”. He is an IEEE member, Chair of the “ECS-SiGe Processing” symposia and head of the Joint-Lab between University of Applied Sciences Wildau and IHP.

Smart Photonics
Intel Deutschland GmbH Intel Deutschland GmbH Seidemann, Georg
Product on Board Test Method for Advanced Reliability Performance of a Large 0.3 mm Pitch Wafer Level Chip Scale Package
Seidemann, Georg

Seidemann, Georg

Intel Deutschland GmbH

Seidemann, Georg

Abstract
Board level reliability tests are well known for electronic packaging qualification for consumer markets in the semiconductor industry. The existing JEDEC/IPC board level methodology tests on daisy chains (DC) for chip-package-board-interaction (CPBI) apply well to traditional packaging solutions for non-extreme low K dielectric (ELK) fab nodes. Future products require new methods of reliability testing for advanced silicon nodes and advanced packaging, especially for the demanding automotive industry.Currently, DC designs do not accurately reflect a product design. DC designs have a reduced layer stack and usually no back-end of line (BEOL) ELK stack. Thus, the second level interconnect performance of the ELK and/or reduced pin count, is not covered. The new approach to reflect product conditions is a component on board setup with industrial standard or to the customer life board with live product. This allows quantification of the complete value chain including chip, package, and board as a component manufacturer. The method reported here comprises results from advanced wafer level chip scale packages (WLCSP) and others. The full functional test used for live components on board including automatic handling generates a higher sensitivity and throughput compared to DC testing. The reuse of this methodology for high volume manufacturing monitoring (HVMM) is also possible.In temperature cycling tests on board (TCoB), a significantly reduced cycle count to failure (up to a factor of 3) with live product on board compared to daisy chain on board tests-the analyzed failure mechanisms are the same. This is due to the higher sensitivity of the full functional test program, specifically, the IR drop sensitivity. This allows for the study of the initiation and propagation of cracks or delamination providing a tool set for enhanced CPBI validation.

Biography
Board level reliability tests are well known for electronic packaging qualification for consumer markets in the semiconductor industry. The existing JEDEC/IPC board level methodology tests on daisy chains (DC) for chip-package-board-interaction (CPBI) apply well to traditional packaging solutions for non-extreme low K dielectric (ELK) fab nodes. Future products require new methods of reliability testing for advanced silicon nodes and advanced packaging, especially for the demanding automotive industry.Currently, DC designs do not accurately reflect a product design. DC designs have a reduced layer stack and usually no back-end of line (BEOL) ELK stack. Thus, the second level interconnect performance of the ELK and/or reduced pin count, is not covered. The new approach to reflect product conditions is a component on board setup with industrial standard or to the customer life board with live product. This allows quantification of the complete value chain including chip, package, and board as a component manufacturer. The method reported here comprises results from advanced wafer level chip scale packages (WLCSP) and others. The full functional test used for live components on board including automatic handling generates a higher sensitivity and throughput compared to DC testing. The reuse of this methodology for high volume manufacturing monitoring (HVMM) is also possible.In temperature cycling tests on board (TCoB), a significantly reduced cycle count to failure (up to a factor of 3) with live product on board compared to daisy chain on board tests-the analyzed failure mechanisms are the same. This is due to the higher sensitivity of the full functional test program, specifically, the IR drop sensitivity. This allows for the study of the initiation and propagation of cracks or delamination providing a tool set for enhanced CPBI validation.

Advanced Packaging Conference
Irish Manufacturing Research Irish Manufacturing Research McConnell, Sean
The implementation of Additive Manufacturing
McConnell, Sean

McConnell, Sean
Senior Technologist
Irish Manufacturing Research

McConnell, Sean

Abstract
3D Printing – still a buzzword or already state of the art? Several forecasts predict a double digit growth rate for the 3D printing market on a global scale. But what does that mean? How can 3D printing support existing business models and even more, how can it create new revenue streams? It all began in the area of labs and prototyping – this session under the context of smart manufacturing will showcase to what extent such technologies have already entered manufacturing, including some showcase examples about how companies are already using 3D printing in their operations.

Biography
Having been introduced to Additive Manufacturing during my Degree in Product Design Engineering, I went to work with multiple companies as a freelance design engineer which led to working with many multi nationals who were beginning their AM journey. Three years ago I begun as a design engineer where I worked with the Principal Investigator to develop out the roadmap, staff and the physical laboratory. Following three successful years of meeting milestones, such as the integration of Metal AM systems and 5 axis Machining centres, along with national and international projects, I became responsible for the technological and strategic direction of the Additive Manufacturing and Machining group, ensuring that the work engaged in is relevant and gives the largest impact to partner companies.

3D Printing
M To top
Medspray BV Medspray BV Nijdam, Wietze
New technology for inhalers and sprays for a healthier world
Nijdam, Wietze

Nijdam, Wietze
Technology Manager
Medspray BV

Nijdam, Wietze

Abstract
Medspray is inventor and manufacturer of innovative spray nozzles. Located at ‘Kennispark’, the business and science park of Twente University in the Netherlands, Medspray uses nano technology to create spray nozzles from silicon with tiny orifices (approximately 2 micrometer in diameter) for a fine nebulization. For reference, a human hair has a diameter of 70 microns.Medspray is ISO 13485 certified for development and manufacturing of medical devices. The production of spray nozzles is located at Medspray in Enschede, in dedicated ISO 7 clean rooms. World wide partners assemble Medspray’s nozzles in mutually developed spray devices. In the summer of 2019 Medspray expects to make its 1 millionth spray nozzle unit, in 2020 we expect to scale further to a production of more than 1 million nozzles per month.Medspray’s mission is based on sustainability. The use of propellants in spray cans for cosmetics and in inhalers can be completely avoided by using Medspray nozzles and simple mechanisms like a plastic pump. Current HFA pMDIs (pressurized metered dose inhalers for e.g. Asthma and COPD) have a similar CO2 exhaust as a car trip of 290 km!Since the inhaler devices have entered the public domain, our nozzles also have caught the attention of other industries, such as cosmetics. Ap apparently the requirements of a spray for the pharmaceutical industry also apply for the cosmetics industry: long actuation time (multiple seconds), narrow particle size distribution, tuneable spray cone and propellant free operation.Medspray, tiny technology for a sustainable future.

Biography
Wietze Nijdam is responsible for technology development at Medspray BV, the Netherlands. Medspray develops novel technology for liquid inhalers and spray devices, based on their proprietary micro nano technology spray nozzles. Wietze joined Medspray eleven years ago to industrialize early developments and outsource silicon.Wietze (born in 1970) has a background in silicon processing (M.Sc. Electrical Engineering, University of Twente) with specialization in perforated thin membranes. After graduation Wietze has worked more than 10 years in MEMS on development of filtration membranes and was involved in the start-up of Medspray.

MEMS along the Value Chain
N To top
NXP NXP Kamphuis, Tonny
Board Level Reliability results for a two side molded WLCSP
Kamphuis, Tonny

Kamphuis, Tonny
Package Pathfinding
NXP

Kamphuis, Tonny

Abstract
Increasingly WLCSP are used as solution for packaging, especially when the area needed for I/O matches the area needed for the function. Industry trend is to go thinner devices and smaller pitches. The mechanical integrity of WLCSP’s is stressed not only in the application, but also during board assembly at the customer.The breakthrough technology presented provides protection for both the top and bottom of the product, thus protecting the 8 corners of the device. Balancing the front and back side thickness of the compound enables reduction of the overall height while at the same time improve the BLR performance compared to more well-known 5 side protected WLCSP in the same package thickness.In 2018, I have presented the process flow and issues related to handling for 2 side molded WLCSP, using different molding materials and processes. I also indicated the board level reliability results for TMCL and drop test, however these were not completed at the time of the conference.In the meantime, we do have the results and the analysis of the results for sharing. The presentation will focus on the Surface Mounting process optimization as well as on the final TMCL and drop test results as function of minimum and typical solder quantity. The last part will be the outlook on this activity to bring this to an industrial standard for the selected materials.

Biography
Tonny Kamphuis received his master in Mechanical Engineering at Twente University in 1986. The same year he joined Philips Semiconductors in the field of IC assembly equipment. He worked in Kaohsiung Taiwan from 1991 to 1992, after which he joined the discrete assembly equipment development department in Nijmegen. He has developed die bonders, wire bonders, molding machines as well as all type of handling equipment for both reel to reel and strip to strip based industrializations. Since the year 2000 he is focusing on assembly process development and industrialization for IC again. In 2007 NXP was founded, at NXP, he has filed several patents related and is focusing on package pathfinding.

Advanced Packaging Conference
O To top
Optimal Plus Optimal Plus Schuldenfrei, Michael
Semiconductors in a world where safety rules supreme
Schuldenfrei, Michael

Schuldenfrei, Michael
Technology Fellow
Optimal Plus

Schuldenfrei, Michael

Abstract
Advanced packaging solutions incorporate multiple die into packages using a broad range of new techniques and technologies. These solutions have many benefits – lowering cost, reducing power consumption, increasing performance and more. However, they come with elevated risk – the more complex the solution, the more care we need to take to ensure we are delivering perfect parts. After all, in safety-critical applications like the autonomous and connected car, failures cannot be tolerated.In this presentation, we will present some of the quality and reliability challenges introduced by advanced packaging technologies and how Big Data Analytics can be leveraged to mitigate the risks.

Biography
Michael joined OptimalPlus in 2006, and brings over 30 years of software and information technology experience. Since joining the company he has served in several leadership roles including Chief Software Architect and CTO. Prior to that he served as Senior Software Architect at SAP, where he led a joint development project with Microsoft. He was also a Software Architect at Microsoft, where he led consulting engagements with the company’s major customers, and VP of R&D at ActionBase, heading up development of the company’s business management enterprise solutions.

Advanced Packaging Conference
P To top
Panasonic Industry Europe GmbH Panasonic Industry Europe GmbH Weber, James
Cutting-edge Plasma Dicing for wafer singulation applied to MEMS devices
Weber, James

Weber, James
Business Development Manager
Panasonic Industry Europe GmbH

Weber, James

Abstract
Authors: James Weber*1, Atsushi Harikai*2, Kiyoshi Arita*2*1: Panasonic Industry Europe GmbHRobert-Koch-Straße 100, 85521 Ottobrunn, Germanyjames.weber@eu.panasonic.com*2: Panasonic Smart Factory Solutions Co., Ltd.2-7 Matsuba-cho, Kadoma-City, Osaka, 571-8502, JapanAbstract:MEMS market trends are demanding dies that are thinner, smaller, and stronger. Conventional line-by-line dicing methods, such as mechanical sawing (“blade dicing”) or laser dicing, are not suitable for fragile MEMS devices, both in terms of economics and reliability.Plasma Dicing is an alternative method to overcome the many challenges of MEMS wafer singulation that are encountered during conventional line-by-line dicing methods.Plasma Dicing for MEMS wafers utilizes plasma trench etch (“dry etch”) technology and is damage-free (no chipping, no cracking), offers smoother sidewalls, is particle-free and enables high-throughput. In addition, flexible chip shape design—including round and offset chips is possible.Plasma Dicing is performed by opening dicing streets on a mask on the wafer surface, and etching where the wafer surface has been exposed. Several masking techniques suitable for MEMS wafers that have been developed by Panasonic can be offered. The throughput of Plasma Dicing depends principally on the thickness of the wafer, and is independent from wafer size, chip size and chip shape. By utilizing Plasma Dicing for MEMS, higher throughput and higher quality than conventional dicing can be achieved. As market trends demand smaller-and-smaller chip sizes—as is typical for MEMS devices—Plasma Dicing offers many benefits when compared to those of conventional line-by-line dicing methods; especially in terms of cost savings and quality increases.Patented techniques, processes and new equipment developed by Panasonic allow for low cost-of-ownership Plasma Dicing of MEMS wafers, and will be discussed in this paper.

Biography
James completed a degree in Mechanical Engineering from the University of Adelaide in Australia in 2006. Since then he has held various roles in Field-test Engineering, Technical Support Engineering, Project Management & Sales for different companies; mainly in the oil and gas industry. Since 2016 he has been the Business Development Manager for microelectronics at Panasonic Factory Solutions Europe. James' main targets are to establish new business in the European Back-end and Front-end Industry; especially in the field of Plasma Dicing and Dry Etching Equipment, but also Plasma Cleaning, Die-attach and Flip-chip technologies.

MEMS along the Value Chain
Panasonic Smart Factory Solutions Panasonic Smart Factory Solutions Okita, Shogo
Suitable Total Process Integration of Plasma Dicing for Each Device Category
Okita, Shogo

Okita, Shogo
Chief Engineer
Panasonic Smart Factory Solutions

Okita, Shogo

Abstract
With the evolution of advanced package technology of electronic components and semiconductor, demands have become severe for chip thinning, miniaturization, flexibility, and high reliability [1].Plasma dicing is a promising singulation technology that dices wafers mounted on ring frames by plasma processing. It can offer many advantages over other dicing methods for thinning / miniaturization of chips, improvement in chip flexural strength, damage-less / particle-less processing and cost reduction [2].To introduce plasma dicing it is necessary to optimize the total process integration and plasma dicing conditions according to chip size and structure of each device.For small size devices without TEG on the dicing street, the process flow using photolithography mask is effective. Very small size, narrow streets and odd shaped chips can be realized by plasma dicing. The mask can be removed by ashing, but if there are high bumps, the ashing time will be longer and CoO (Cost of Owner-ship) will be worse. Therefore, Panasonic developed a method to remove the mask in the ring frame mounting state using a chemical without dicing tape damage. As a result, Panasonic have been able to provide a total process that enables mask removal without residue without deteriorating CoO.In case of dicing street with TEG, singulation can be realized by a hybrid process combining laser grooving and plasma dicing. By using a suitable water-soluble mask for the same method, it was possible to remove the mask without residue after dicing, while forming and protecting the mask on structures such as bumps.[1] S. Okita, Plasma Technologies Ease Wafer Manufacturing of IoT Devices, AEI February 2017[2] S Okita, Improvement of the chip flexural strength by the Plasma Dicing technology, 2015 International Symposium on Dry Process

Biography
Shogo Okita is the chief engineer at Panasonic Smart Factory Solutions, currently involving the development of plasma dicing equipment and process as well as the total process integration of plasma dicing.In 1997, he joined Matsushita Electric Industrial Co.,Ltd. (now, Panasonic Co.,Ltd.) as a process engineer. Since then, he has been engaged in R&D activity and product development and worked in development of various plasma sources and processes for dry etching equipment in the Si & Compound semiconductor, MEMS and LCD devices fields. He is the author of many patents.He received the B.S. degree in physics from Kwansei Gakuin University, Japan.

Advanced Packaging Conference
PMT Corporation PMT Corporation Miyake, Kenji
Half-inch FOWLP Process Line utilizing Minimal FAB
Miyake, Kenji

Miyake, Kenji
Executive Officer
PMT Corporation

Miyake, Kenji

Abstract
Minimal fab technology is a different method of semiconductor production. Integrated chip (IC) manufacturing facilities usually require billions of dollars in investment, which can be provided by only a few companies with the potential for high capital investments. Moreover, the conventional IC fabs require months to set up; whereas, minimal fabs can be up and running in days.The minimal fab does not require a clean room environment. Instead, the wafers are placed in a secured, clean-room-like container termed as the “shuttle” and loaded on the process stations. The transparent red material makes the wafer visible and blocks the UV radiation. It has been noted that the minimal fab uses maskless exposure technology, which means the traditional photomask preparation time (which typically takes months) can be avoided. Minimal fabs use direct draw and exposure, which makes it possible to avoid the photomasks. Furthermore, as the production is on wafer-to-wafer basis, the feedback is rapid.From an operational perspective, owing to the high capital cost and duration involved in set-up, conventional fabs require 24 hours of operations. Whereas, minimal fabs are able to operate effectively based on flexible production and working hours. Furthermore, minimal fabs require less time to convert research into production. Moreover, as minimal fabs do not require clean room environments, and as their systems are designed to be energy efficient and smaller, power consumption is estimated to be just one-tenth of that of conventional IC fabs. Therefore, Minimal fabs prove to be both operationally flexible and cost-efficient.Half-inch FOWLP Process Line utilizing Minimal Fab will be presented.

Biography
Dr. Kenji Miyake received his Ph.D. degree in the Graduate School of Science and Engineering from Yamaguchi University in Japan.He worked for Texas Instruments Japan for 28 years, since 1980.He conducted many international IT projects as Asia PacificAssembly Automation Manager in Texas Instruments Japan.He moved to PMT Corporation from Texas Instrument Japan in 2010. He has engaged in Minimal Foundry as Executive Officer, PMT Corporation.He has contributed the international semiconductor symposiums that are AEC/APC (Advanced Equipment Control/Advanced Process Control) and ISSM (International Symposium of Semiconductor Manufacturing) as Program Committee since 2005.

Advanced Packaging Conference
R To top
Robert Bosch GmbH Robert Bosch GmbH Gromala, Przemyslaw
Reliability Requirements of Advanced Packaging in the Era of Electrified, Automated and Connected Driving
Gromala, Przemyslaw

Gromala, Przemyslaw
Simulation senior expert
Robert Bosch GmbH

Gromala, Przemyslaw

Abstract
Development of automotive electronic systems is driven by three major trend: Electrification, Automation, and Connectivity. Each of these trends will bring specific reliability challenges:Electrification will revolutionize the entire powertrain and the required road infrastructure. Gradually but steadily, combustion engines will decrease their market share. Power electronics will be one of the key drivers of this development by remarkable innovations. New encapsulating materials will be introduced to meet these new requirements. In addition, sensors and control electronics will be added directly to the power stages for enhanced performance and safety. This increases the heterogeneity and complexity of these systems.Automated driving will revolutionize transportation system. By 2025, conditionally and highly automated driving will reach SAE levels 3 and 4, respectively. By 2030, it will also be available in complex traffic situations, e.g., urban areas, and will reach SAE level 5. The highly automated vehicles will increase safety, provide greater comfort, and improve the traffic flows. New service modes seem to give a clear preference to car-sharing options over individual ownership. Consequently, the total operational time will significantly increase.Connectivity will introduce consumer inspired technology components to harsh environments. Advanced integration and packaging schemes, such as system on chip (SoC) and system in package (SiP) based on smallest technologies nodes (e.g., 7 nm), will be introduced to automobiles with high reliability and fail-safe operation requirements.In my presentation I will try to answer what are the emerging reliability challenges for electronic packaging due to three major trends in automotive.

Biography
Dr Przemyslaw Gromala is a simulation senior expert at Robert Bosch GmbH, Automotive Electronics in Reutlingen. Currently leading an international simulation team and FEM validation and verification lab with the focus on implementation of simulation driven design for electronic control modules and multi-chip power packaging for hybrid drives. His technical expertise includes material characterization and modeling, multi-domain and multi-scale simulation incl. fracture mechanics, V&V techniques, and prognostics and health management for safety related electronic smart systems.Prior joining Bosch Mr Gromala worked at Delphi development center in Krakow, as well as at Infineon research and development center in Dresden.He is an active committee member of the IEEE conferences: ECTC, EuroSimE, iTherm; ASME: InterPACK. Active committee member of EPoSS – defining R&D and innovation needs as well as policy requirements related to Smart Systems Integration and integrated Micro- and Nanosystems.He holds a PhD in mechanical engineering from Cracow University of Technology in Poland.

Advanced Packaging Conference
S To top
SUSS MicroTec SUSS MicroTec Schmidt, Thomas
Advanced Plasma Surface Activation for Hybrid Fusion Bonding
Schmidt, Thomas

Schmidt, Thomas
Product Manager
SUSS MicroTec

Schmidt, Thomas

Abstract
Wafer bonding can be considered as one of the key enabling technologies for future 3D devices in the microelectronic/photonic system industry. However, complementary metal-oxide-semiconductor (CMOS) structures present on those devices require dedicated and compatible low temperature (LT) bonding schemes such as hybrid bonding. In LT bonding research hybrid bonding has lately become more and more the focus of attention, due to distinct advantages especially within semiconductor processing.In this paper SUSS MicroTec introduces a novel highly flexible approach for atmospheric plasma surface activation that allows for versatile full wafer treatments and high bonding energies. The absence of directed ions and electrical fields in general translate in full CMOS compatibility of the new plasma concept, making it especially suited for hybrid bonding. The described surface activation approach can be optionally integrated in automated bond cluster platforms from SUSS MicroTec via an innovative tool integration concept also presented in this paper. The integration concept comes along with distinct advantages over vacuum plasma, such as increased throughput, higher cleanliness, lower tool footprint, reduced wafer handling, lower cost of ownership etc. as demonstrated in the scope of this publication.The highly flexible chemistry that can be used within the new plasma activation approach also enables metal-oxide removal, i.e. reduction of copper oxide surfaces present at wafer-to-wafer (W2W) and collective die-to-wafer (D2W) hybrid bonding applications for 3D integration schemes. In this work surface free energy (including polar and dispersive components), defectivity, bond-strength, surface hydration and the dependence of surface pre-treatment have been studied. Water contact angles (WCA) down to <7°C and free surface energies in the range of 77 mN/mm have been obtained, resulting in wafer bond strengths for low temperature fusion bonding significantly exceeding 2 J/mm².

Biography
Thomas Schmidt is Product Manager in the Bonder Division of SUSS MicroTec in Sternenfels. After his graduation in Microsystems Technology at the University of Applied Sciences in Kaiserslautern he has held various positions in MEMS/semiconductor processing and has lectured on advanced lithography as well as on MEMS and CMOS fabrication.Since December 2017 Thomas Schmidt is a member of the Bonder Division of SUSS MicroTec with responsibility for the product line "Permanent Wafer Bonding" focusing on automated cluster platforms. This platforms address established bonding techniques for MEMS/packaging as well as hybrid fusion bonding for advanced packaging. Thomas Schmidt has authored and co-authored several papers on various topics, including microthermoforming and microoptics.

Advanced Packaging Conference
T To top
Technische Universität Dresden Technische Universität Dresden Meier, Karsten
Development of a Modular Test Setup for Reliability Testing under Harsh Environment Conditions
Meier, Karsten

Meier, Karsten

Technische Universität Dresden

Meier, Karsten

Abstract
The increasing contribution of electronics to the functionality of automotive vehicles pursues the demand for highly integrated, low power, and very reliable electronics. To fulfil the application requirements of automotive electrification and connectivity the electronics packaging performance has become a dominant factor of the electronics system capability. In addition, chip package interaction has become important in advanced semiconductor technology nodes.The Industry is developing and manufacturing various package approaches to meet different application needs. These packages are exposed to multiple load cases. Both, the large number of package approaches as well as the variety of mission profiles have to be considered in the development process of reliable packages which leads to the need to develop a modular test setup concept.In this presentation a modular test setup is going to be shown which addresses the ability to perform multiple reliability analysis of different package types at board and package level according to standard (e.g. AEC-Q100) or mission profile specifications. Using the test setup packages with sizes of up to 50x50 mm², a pitch as small as 0.4 mm and very high I/O counts (>1,000) can be considered. The recently used configuration is capable for simultaneous testing of 16 packages. Since its modular design, the setup can be adopted to other test lot sizes and test group configurations easily.As an initial verification prove point biased temperature humidity tests (THB 85/85) for up to 1,500 hours on a FCCSP package have been accomplished. Detailed characterisation of the developed test setup - offering a maximum voltage of 35 V or maximum current of 1.5 A for up to 8 individual channels - under THB conditions has been done. Monitoring with a high resolution in terms of time (<1 s), voltage (<1 mV) and current (<<1 µA) is available. This enables tracking of immediate humidity responses and package humidity uptake.Additional setup enhancements have be implemented to prepare for conducting temperature cycling on board and uniaxial vibration tests.

Biography
Dr. Karsten Meier is with the Institute of Electronic Packaging Technology at the Technische Universität Dresden (Dresden, Germany) since 2006. After studying electrical engineering he received his Ph.D. from Technische Universität Dresden in 2015. During his studies he spent a research visit at the Packaging Research Center at the Georgia Institute of Technology in Atlanta (Georgia, USA). At the Institute of Electronic Packaging Technology he is working with the board level reliability group and responsible as assistant director. His research activities cover projects on packaging technology developments and package reliability for 5G and automotive applications, power electronics, material characterisation, and thermo-mechanical simulation. Recently, he also supports a research collaboration with the Center for Advanced Life Cycle Engineering at the University of Maryland (Maryland, USA) on combined mechanical and thermal loadings on solder interconnections. Karsten Meier is author of multiple publications. He is a member of the IEEE EPTC sub-committee Advanced Packaging, the IEEE ECTC sub-committee Thermal/Mechanical Simulation and Characterisation, and the IEEE ESTC sub-committee Reliability of Electronic Devices and Systems. As a reviewer he supports the IEEE EuroSimE conference.

Advanced Packaging Conference
Technological University Dublin Technological University Dublin Walsh, John
From Products to Prostates: Experiments in 3D Printing Design and Creative Arts
Walsh, John

Walsh, John
Assistant Head of School
Technological University Dublin

Walsh, John

Abstract
This presentation will look at the ways in which 3D printing is being used and taught at Dublin School of Creative Arts, TU Dublin. It presents a diverse range of 3D Printing / Additive Manufacturing projects and applications ranging from printing of Prosthetic Prostates and Tumours, to Drones, to Guitars and Sculptural Artefacts. While the context for the presentation will be in the field of Design and Creative Arts, the focus will be on how 3D printing can be used as a tool to solve a diverse range of problems.

Biography
John Walsh is Assistant Head of School and Lecturer in Product Design at Dublin School of Creative Arts, TU Dublin. He is founder of TU Dublin CreateLAB, which supports industry and entrepreneurs in the development of new products. He is also owner of Made Design Consultancy, a Juror at the iF Design Awards and is a Past-President of the Institute of Designers in Ireland.

3D Printing
TechSearch International, Inc. TechSearch International, Inc. Vardaman, Jan
Packaging Trends for AI
Vardaman, Jan

Vardaman, Jan
President
TechSearch International, Inc.

Vardaman, Jan

Abstract
Artificial Intelligence (AI) makes it possible for machines to learn from experience, adjust to new inputs and perform human-like tasks. AI or deep learning is expected to be applied to a wide range of applications, including connectivity or Internet of Things (IoT), big data processing and servers, cloud services, autonomous driving, 5G communications, smart factory or Industry 4.0, robotics, AR/VR. The package choice depends on many factors including design, density, reliability, and supply chain. This presentation examines the applications using AI and the packages in production today. The presentation also discusses future packages expected for these applications. Package choice, design, and materials impact and the importance of co-design will be discussed.

Biography
E. Jan Vardaman is president and founder of TechSearch International, Inc., which has provided market research and technology trend analysis in semiconductor packaging since 1987. She is the co-author of How to Make IC Packages (by Nikkan Kogyo Shinbunsha), a columnist with Printed Circuit Design & Fab/Circuits Assembly, and the author of numerous publications on emerging trends in semiconductor packaging and assembly. She is a senior member of IEEE EPS and is an IEEE EPS Distinguished Lecturer. She is a member of SEMI, SMTA, IMAPS, and MEPTEC. She received the IMAPS GBC Partnership award in 2012 and the Daniel C. Hughes, Jr. Memorial Award in 2018. She is an IMAPS Fellow. Before founding TechSearch International, she served on the corporate staff of Microelectronics and Computer Technology Corporation (MCC), the electronics industry’s first pre-competitive research consortium.

Advanced Packaging Conference
Tyndall National Institute Tyndall National Institute Gunning, Fatima
Coherent photonic transmitters: what, how and when?
Gunning, Fatima

Gunning, Fatima
Senior Staff Researcher
Tyndall National Institute

Gunning, Fatima

Abstract
As capacity demands in optical communications continues to increase, and with standard single mode optical fibres (SMF) still prevailing as the main communications channel, techniques to maximise the spectral efficiency of SMF's available bandwidth are now moving from research to implementation. While DSP and higher order modulation formats are becoming widely available commercially, in particular for 400G-600G approaches, Tb/s capacities per transponder are likely to be achieved with multi-carrier schemes. In this talk, we will review the need for multi-carrier coherent transmitters, what they are and show potential configurations, discuss how to overcome foreseenble challenges, and especulate when this technology will be potentially ready.

Biography
Dr Gunning is a Senior Staff researcher and Head of Graduate Studies at Tyndall National Institute, and Senior Research Fellow at the Physics Department, University College Cork, Ireland. She worked previously at Corning Research Centre in UK, had several internships at British Telecom at Adastral Park in UK, and holds a Master and PhD degrees in Physics from Pontifícia Universidade Católica do Rio de Janeiro, Brazil. She was part of the team pioneering on Optical Coherent Wavelength Division Multiplexing (also known as “superchannels” or coherent transmitters) at Tyndall. Her current research focus on the development novel devices for high capacity systems at 1.5 and 2 microns wavelengths, and on incorporating adaptive physical layer solutions with Software Defined Networks for network efficiency, control and management. Dr Gunning collaborates closely with Tyndall’s semiconductor devices team on the next generation of integrated photonic devices, and incorporates high-speed testing at chip level in the lab. She also volunteers and leads initiatives to promote Science in the community, and in particular efforts to increase gender representation in Physics and Engineering at all levels. She’s the acting chair for Empowering Women Committee @ Tyndall, participates in UCC’s Athena Swan focus groups, champions Tyndall’s Centre of Integrated Photonics (IPIC) gender action plan and the IEEE Photonics Society as AVP for Multicultural Outreach.

Smart Photonics
U To top
Univ. grenoble Alpes, CNRS, LTM Univ. grenoble Alpes, CNRS, LTM Pargon, Erwine
Si and SiN High-Q microresonators for quantum and nonlinear optics applications
Pargon, Erwine

Pargon, Erwine
Associate researcher
Univ. grenoble Alpes, CNRS, LTM

Pargon, Erwine

Abstract
Silicon is an attractive platform for correlated photon pairs sources that can be used for quantum cryptography and computing, while SiN On Insulator is promising for Kerr frequency comb source proposed in many nonlinear optics applications, such as on-chip spectroscopy, and terabit coherent communications. In both cases, high-Quality factor microresonators are required to get power-efficient nonlinear sources. The quality factor of the ring is directly correlated to the optical propagation losses caused by the material bulk or surface absorption, or scattering losses generated by roughness. In this work, we report on the fabrication and testing of Si and SiN microresonators with record values of quality factor.In sub-micrometric Si waveguides, scattering loss is the primary source of optical propagation losses. High temperature H2 annealing treatment was introduced in the fabrication process flow to minimize the Si sidewalls roughness at the atomic scale, enabling the fabrication of high intrinsic Q (>6 x 105) Si micro-resonators for on-chip heralded single photon quantum sources by spontaneous four-wave mixing. On the other hand, the absorption loss due to residual NH bonds in the SiN is the limiting factor for achieving low loss SiN waveguide. By introducing high temperature N2 annealing treatment in the process fabrication, we demonstrate critically coupled SiN resonators with intrinsic quality factors of Q > 6x106 using high-confinement waveguide dimensions (1.7-µm-wide, 820-nm-thick) with corresponding optical losses approaching 5 dB/m. The statistical study performed on 200mm wafer shows a variability of the optical results of 0.8% which proves the high reproducibility of the fabrication process. Using such high-quality factor devices, we report the possibility to generate Kerr frequency combs at sub-mW input powers coupled into the bus high-confinement waveguide.This work was supported by the the French National program IRT Nanoelec and the RENATECH network

Biography
Erwine Pargon is currently associate researcher at the “Laboratoire des Technologies de la Microélectronique” (LTM), a joint academic unit of the CNRS and Grenoble Alpes University in Grenoble, France. She received her M.S. in 2001 and Ph. D. in 2004 in Material Sciences from the University of Grenoble-Alpes. After a year of research at the Chemical Engineering department of UC Berkeley in USA, she joined in 2006 the LTM/CNRS located on the CEA/LETI site of Grenoble. At LTM, she has the capability to conduct applied research in a professional environment allowing unique partnerships with key players of the Microelectronics industry. Her research focuses on the development and characterization of plasma etching processes involved in the elaboration of advanced devices for microelectronic, photonics and photovoltaics applications. The common objective of her research work is the development of damage free plasma etching processes. In particular, she worked on an important issue in plasma patterning, the pattern sidewalls roughness, that affects device performances whatever the targeted applications. She proposed methods to characterize it accurately and to minimize it. She has co-authored more than 70 papers in peer reviewed journals and has participated to about 30 invited talks at international conferences. In 2010, she was awarded the Bronze Medal of CNRS for her research achievements. She led the LTM etch team from 2008 to 2010. She is a regular reviewer of several international journals (JVST, Plasma process and polymer, Microelectronic engineering..). She is a committee member of the “Advanced Etch Technology for Nanopatterning” conference of the SPIE since 2012, of the Plasma Etch and Strip in Microelectronics (PESM) workshop since 2013 and of the Plasma Science Technology Division of the AVS Symposium since 2017.

Smart Photonics
University of Twente University of Twente Zwanenburg, Floris
Ambipolar quantum dots in planar silicon
Zwanenburg, Floris

Zwanenburg, Floris
Associate Professor
University of Twente

Zwanenburg, Floris

Abstract
We create ambipolar quantum dots in planar silicon nanoscale transistors. We first investigate the conformity of Al, Ti and Pd nanoscale gates by means of transmission electron microscopy [1]. Next we define low-disorder electron quantum dots with Pd gates [2], and depletion-mode hole quantum dots in undoped silicon [3]. For the latter we use fixed charge in a SiO2/Al2O3 dielectric stack to induce a 2DHG at the Si/SiO2 interface. The depletion-mode design avoids complex multilayer architectures requiring precision alignment and allows directly adopting best practices already developed for depletion dots in other material systems. Finally, I will show ambipolar charge sensing: we have fabricated a single-electron transistor next to a single-hole transistor, and tuned both quantum dots to simultaneously sense charge transitions of the other quantum dot. Using active charge sensing the single-hole transistor can detect the few-charge regime in the electron quantum dot.[1] P. C. Spruijtenburg et al., Nanotechnology, (2018).[2] M. Brauns et al., Scientific Reports 8, 5690, (2018).[3] S. V. Amitonov et al., Applied Physics Letters 112, 023102 (2018).

Biography
Floris Zwanenburg (1976) studied applied physics at the TU Delft. In 2008 he received his PhD for research on semiconductor nanowires with Leo Kouwenhoven. As a post-doc at UNSW in Sydney he worked with silicon quantum dots. This system has a unique fabrication scheme offering unprecedented control over all relevant parameters, as he demonstrated by reaching the single-electron regime in a highly tunable Si quantum dot. With his team at UNSW he has also used this system to read out the spin of a single electron (Nature, 2010) and to create a nuclear spin qubit (Nature, 2013). In 2011, he returned to the Netherlands for a tenure track position at the University of Twente. After initial collaborative efforts with the Dzurak team from UNSW on silicon quantum-dot technology, his team has extended this design to an ambipolar circuit, with which he has defined electron and hole quantum dots in a single device. Since 2013 he has had a new project on quantum dots and superconductivity in Ge/Si core/shell nanowires. In the past ten years he has become an expert in silicon quantum electronics: the quantum mechanical behaviour of single electron or hole spins confined to (artificial) atoms in silicon.

Disruptive Computing
V To top
Veeco Veeco Vijayendran, Anil
Addressing Impact of Shrinking Line/Space Dimensions on PR Strip, UBM/RDL Etch and Wafer Thinning Processes
Vijayendran, Anil

Vijayendran, Anil

Veeco

Vijayendran, Anil

Abstract
Moore’s law sharpened focus on shrinking gate dimensions to drive performance and cost. This paper explains emerging challenges as Moore’s law slows, with focus transitioning to the packaging side as the industry adopts heterogeneous integration and smaller line/space dimensions for better performance.Technical requirements are more challenging; e.g., the interconnect and bumping process flow is as follows: barrier/seed layer deposition, patterning, plating, photoresist (PR) strip, and etch. Designers are using redistribution layers (RDL) in flip-chip designs to redistribute I/O pads to bump pads without changing the I/O pad placement. Under bump metallization (UBM) enhances reliability by providing the critical interface between the metal pad and solder bump. Higher I/O density with improved reliability and performance also leads to shrinking line geometries (from >10µm to sub-1µm) along with smaller bump diameter and pitch. As a result, the photoresist becomes more difficult to remove, calling for more effective methods.Shrinking dimensions pose similar challenges in UBM/RDL etch. A critical requirement is to minimize undercut while removing barrier/seed layers. Higher undercut impacts mechanical integrity while insufficient removal leads to poor yield.As thinner devices also drive performance and/or optimized form factor, wafers get thinner in MEMS, Power, RF, Image Sensors. Grinding damages the wafer surface, leaving microcracks, residual stresses and edge chipping. A subsequent process is needed to repair the surface, reduce stress and achieve desired thickness. Wet processing has emerged as a preferred method for surface treatment and wafer thinning while offering higher uniformity at lower cost.This presentation explains technical results for PR strip, UBM/RDL etch and wafer thinning steps.

Biography
Anil Vijayendran earned his MBA from the University of California, Berkeley, and a master’s and bachelor’s degree in chemical engineering from Massachusetts Institute of Technology. He has served in roles of increasing responsibility in technical, marketing and product development and is currently vice president of marketing of Veeco’s precision surface processing business unit, where he leads all end-to-end product management and marketing for the PSP division. Prior to his role with Veeco, Vijayendran was the vice president of technical marketing for MiaSolé and has previously served as the director of product management at Novellus Systems, a Lam Research company.

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